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SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots with Good Yield

The six-phase Lee model code was developed to compute the anomalous resistance phase (RAN) following the pinch phase in a plasma focus (PF) discharge. One important method to check such modeling is to look at the soft X-ray (SXR) emission time profile and to correlate this to the PF dynamics. A...

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Bibliographic Details
Main Authors:	Saw, Sor Heoh, Rawat, Rajdeep S., Lee, Paul, Talebitaher, Alireza, Abdou, Ali. E, Chong, Perk Lin, Roy, Federico, Ali, Jalil, Lee, Sing
Format:	Article
Language:	English
Published:	IEEE 2013
Subjects:	QC Physics
Online Access:	http://eprints.intimal.edu.my/176/ http://eprints.intimal.edu.my/176/1/SXR%20measurements%20in%20INTI%20PF%20operated%20in%20neon%20to%20identify%20typical%20%28normal%20n%29%20profile%20for%20shots%20with%20good%20yield.pdf

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