APA (7th ed.) Citation

Saw, S. H., Rawat, R. S., Lee, P., Talebitaher, A., Abdou, A. E., Chong, P. L., . . . Lee, S. (2013). SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots with Good Yield. IEEE.

Chicago Style (17th ed.) Citation

Saw, Sor Heoh, Rajdeep S. Rawat, Paul Lee, Alireza Talebitaher, Ali. E. Abdou, Perk Lin Chong, Federico Roy, Jalil Ali, and Sing Lee. SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots with Good Yield. IEEE, 2013.

MLA (9th ed.) Citation

Saw, Sor Heoh, et al. SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots with Good Yield. IEEE, 2013.