Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code
The soft X-ray yield versus pressure curves of NX1 and NX2 plasma focus machines have been measured and published for different pressures and electrode configurations. In this work, the numerical experiments are carried out, using Lee model code. The Lee model code is configured for each of these de...
| Main Authors: | Gautam, P., Khanal, R., Saw, S. H., Lee, S. |
|---|---|
| Format: | Article |
| Published: |
Springer US
2015
|
| Subjects: | |
| Online Access: | http://eprints.intimal.edu.my/14/ |
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