Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code
The soft X-ray yield versus pressure curves of NX1 and NX2 plasma focus machines have been measured and published for different pressures and electrode configurations. In this work, the numerical experiments are carried out, using Lee model code. The Lee model code is configured for each of these de...
| Main Authors: | , , , |
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| Format: | Article |
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Springer US
2015
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| Online Access: | http://eprints.intimal.edu.my/14/ |
| _version_ | 1848766375796932608 |
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| author | Gautam, P. Khanal, R. Saw, S. H. Lee, S. |
| author_facet | Gautam, P. Khanal, R. Saw, S. H. Lee, S. |
| author_sort | Gautam, P. |
| building | INTI Institutional Repository |
| collection | Online Access |
| description | The soft X-ray yield versus pressure curves of NX1 and NX2 plasma focus machines have been measured and published for different pressures and electrode configurations. In this work, the numerical experiments are carried out, using Lee model code. The Lee model code is configured for each of these devices NX1 and NX2 by fitting computed total discharge current waveform against a measured total discharge current waveform. The computed soft X-ray yield versus pressure curves are compared with the laboratory measured soft X-ray yield versus pressure data. The comparison shows agreement between computation and measurement of several important features of the yield versus pressure curves. |
| first_indexed | 2025-11-14T11:50:09Z |
| format | Article |
| id | intimal-14 |
| institution | INTI International University |
| institution_category | Local University |
| last_indexed | 2025-11-14T11:50:09Z |
| publishDate | 2015 |
| publisher | Springer US |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | intimal-142016-09-09T07:19:13Z http://eprints.intimal.edu.my/14/ Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code Gautam, P. Khanal, R. Saw, S. H. Lee, S. QC Physics The soft X-ray yield versus pressure curves of NX1 and NX2 plasma focus machines have been measured and published for different pressures and electrode configurations. In this work, the numerical experiments are carried out, using Lee model code. The Lee model code is configured for each of these devices NX1 and NX2 by fitting computed total discharge current waveform against a measured total discharge current waveform. The computed soft X-ray yield versus pressure curves are compared with the laboratory measured soft X-ray yield versus pressure data. The comparison shows agreement between computation and measurement of several important features of the yield versus pressure curves. Springer US 2015 Article PeerReviewed Gautam, P. and Khanal, R. and Saw, S. H. and Lee, S. (2015) Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code. Journal of Fusion Energy, 34 (3). pp. 686-693. ISSN 1572-9591 http://link.springer.com/journal/10894 10.1007/s10894-015-9872-0 |
| spellingShingle | QC Physics Gautam, P. Khanal, R. Saw, S. H. Lee, S. Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code |
| title | Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code |
| title_full | Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code |
| title_fullStr | Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code |
| title_full_unstemmed | Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code |
| title_short | Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code |
| title_sort | comparison of measured soft x-ray yield versus pressure for nx1 and nx2 plasma focus devices against computed values using lee model code |
| topic | QC Physics |
| url | http://eprints.intimal.edu.my/14/ http://eprints.intimal.edu.my/14/ http://eprints.intimal.edu.my/14/ |