APA (7th ed.) Citation

Gautam, P., Khanal, R., Saw, S. H., & Lee, S. (2015). Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code. Springer US.

Chicago Style (17th ed.) Citation

Gautam, P., R. Khanal, S. H. Saw, and S. Lee. Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code. Springer US, 2015.

MLA (9th ed.) Citation

Gautam, P., et al. Comparison of Measured Soft X-Ray Yield Versus Pressure for NX1 and NX2 Plasma Focus Devices Against Computed Values Using Lee Model Code. Springer US, 2015.