An SEM flashover: technique to characterize wide band gap insulators
This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of wide band gap insulators. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated insulator surface at once. The charging can...
| Main Authors: | , , |
|---|---|
| Format: | Proceeding Paper |
| Language: | English |
| Published: |
2006
|
| Subjects: | |
| Online Access: | http://irep.iium.edu.my/9423/ http://irep.iium.edu.my/9423/1/An_SEM_Flashover_-_IEEE_2006.pdf |
| _version_ | 1848777124944543744 |
|---|---|
| author | Sutjipto, Agus Geter Edy Muhida, Riza Takata, Masasuke |
| author_facet | Sutjipto, Agus Geter Edy Muhida, Riza Takata, Masasuke |
| author_sort | Sutjipto, Agus Geter Edy |
| building | IIUM Repository |
| collection | Online Access |
| description | This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of wide band gap insulators. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated insulator surface at once. The charging can create an electric field distribution in the surface. The increase of electric field at the surface may exceed a critical value when a surface breakdown/flashover occurs. An
insulation property can be evaluated by varying the duration of charging/electron bombardment which is needed to initiate an optically-visible flashover treeing formation (hereinafter time to flashover treeing/TTF). In this paper, high purity MgO as a wide band gap insulator material was used as a main investigated sample. Varying addition of high purity SiO2 was used to change insulator property of the MgO. Under a certain SEM's energy and magnification, SiO2 addition has change the duration of charging up to surface
breakdown. Therefore, this technique may be useful for
investigating an insulation property of materials under
electron bombardment such as MgO in a plasma display
panel, high voltage insulator, and other insulator
materials for space technology. |
| first_indexed | 2025-11-14T14:41:00Z |
| format | Proceeding Paper |
| id | iium-9423 |
| institution | International Islamic University Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-14T14:41:00Z |
| publishDate | 2006 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | iium-94232012-04-04T04:13:38Z http://irep.iium.edu.my/9423/ An SEM flashover: technique to characterize wide band gap insulators Sutjipto, Agus Geter Edy Muhida, Riza Takata, Masasuke TK452 Electric apparatus and materials. Electric circuits. Electric networks This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of wide band gap insulators. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated insulator surface at once. The charging can create an electric field distribution in the surface. The increase of electric field at the surface may exceed a critical value when a surface breakdown/flashover occurs. An insulation property can be evaluated by varying the duration of charging/electron bombardment which is needed to initiate an optically-visible flashover treeing formation (hereinafter time to flashover treeing/TTF). In this paper, high purity MgO as a wide band gap insulator material was used as a main investigated sample. Varying addition of high purity SiO2 was used to change insulator property of the MgO. Under a certain SEM's energy and magnification, SiO2 addition has change the duration of charging up to surface breakdown. Therefore, this technique may be useful for investigating an insulation property of materials under electron bombardment such as MgO in a plasma display panel, high voltage insulator, and other insulator materials for space technology. 2006 Proceeding Paper PeerReviewed application/pdf en http://irep.iium.edu.my/9423/1/An_SEM_Flashover_-_IEEE_2006.pdf Sutjipto, Agus Geter Edy and Muhida, Riza and Takata, Masasuke (2006) An SEM flashover: technique to characterize wide band gap insulators. In: 8th International Conference on Properties and Applications of Dielectric Materials, 26 - 30 June 2006, Bali, Indonesia. |
| spellingShingle | TK452 Electric apparatus and materials. Electric circuits. Electric networks Sutjipto, Agus Geter Edy Muhida, Riza Takata, Masasuke An SEM flashover: technique to characterize wide band gap insulators |
| title | An SEM flashover: technique to characterize wide band gap insulators |
| title_full | An SEM flashover: technique to characterize wide band gap insulators |
| title_fullStr | An SEM flashover: technique to characterize wide band gap insulators |
| title_full_unstemmed | An SEM flashover: technique to characterize wide band gap insulators |
| title_short | An SEM flashover: technique to characterize wide band gap insulators |
| title_sort | sem flashover: technique to characterize wide band gap insulators |
| topic | TK452 Electric apparatus and materials. Electric circuits. Electric networks |
| url | http://irep.iium.edu.my/9423/ http://irep.iium.edu.my/9423/1/An_SEM_Flashover_-_IEEE_2006.pdf |