Novel characterization technique by using an SEM

Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron...

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Main Authors: Sutjipto, Agus Geter Edy, -, Jufriadi, Muhida, Riza, Takata, Masasuke
Format: Proceeding Paper
Language:English
Published: 2008
Subjects:
Online Access:http://irep.iium.edu.my/9393/
http://irep.iium.edu.my/9393/1/AGUS_-_Proc_ISDEV_-_2008.pdf
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author Sutjipto, Agus Geter Edy
-, Jufriadi
Muhida, Riza
Takata, Masasuke
author_facet Sutjipto, Agus Geter Edy
-, Jufriadi
Muhida, Riza
Takata, Masasuke
author_sort Sutjipto, Agus Geter Edy
building IIUM Repository
collection Online Access
description Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron beam to charge an insulator without metallic coating and to produce a surface discharging (surface breakdown/flashover) but also to observe the visible charging and discharging on the sample surface. A model of electric field distribution on the surface was developed in order to explain charging and discharging phenomena. Since charging and discharging process involves incubation time, therefore this process can be used to characterize or evaluate the insulation property of materials under electron bombardment.
first_indexed 2025-11-14T14:40:57Z
format Proceeding Paper
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institution International Islamic University Malaysia
institution_category Local University
language English
last_indexed 2025-11-14T14:40:57Z
publishDate 2008
recordtype eprints
repository_type Digital Repository
spelling iium-93932012-04-06T07:18:53Z http://irep.iium.edu.my/9393/ Novel characterization technique by using an SEM Sutjipto, Agus Geter Edy -, Jufriadi Muhida, Riza Takata, Masasuke TK452 Electric apparatus and materials. Electric circuits. Electric networks Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron beam to charge an insulator without metallic coating and to produce a surface discharging (surface breakdown/flashover) but also to observe the visible charging and discharging on the sample surface. A model of electric field distribution on the surface was developed in order to explain charging and discharging phenomena. Since charging and discharging process involves incubation time, therefore this process can be used to characterize or evaluate the insulation property of materials under electron bombardment. 2008 Proceeding Paper PeerReviewed application/pdf en http://irep.iium.edu.my/9393/1/AGUS_-_Proc_ISDEV_-_2008.pdf Sutjipto, Agus Geter Edy and -, Jufriadi and Muhida, Riza and Takata, Masasuke (2008) Novel characterization technique by using an SEM. In: XXIII-rd Int. Symp. on Discharges and Electrical Insulation in Vacuum (ISDEIV 2008), 15 - 19 September 2008, Bucharest, Romania.
spellingShingle TK452 Electric apparatus and materials. Electric circuits. Electric networks
Sutjipto, Agus Geter Edy
-, Jufriadi
Muhida, Riza
Takata, Masasuke
Novel characterization technique by using an SEM
title Novel characterization technique by using an SEM
title_full Novel characterization technique by using an SEM
title_fullStr Novel characterization technique by using an SEM
title_full_unstemmed Novel characterization technique by using an SEM
title_short Novel characterization technique by using an SEM
title_sort novel characterization technique by using an sem
topic TK452 Electric apparatus and materials. Electric circuits. Electric networks
url http://irep.iium.edu.my/9393/
http://irep.iium.edu.my/9393/1/AGUS_-_Proc_ISDEV_-_2008.pdf