The use of SEM to investigate the effect of an electron beam on the optically-visible flashover treeing of MgO ceramic
This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of insulators under electron bombardment. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an insulator surface simultaneously. The di...
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Springer Science+Business Media
2007
|
| Subjects: | |
| Online Access: | http://irep.iium.edu.my/8676/ http://irep.iium.edu.my/8676/1/AGUS_-_Journal_of_Materials_Science_2007.pdf |
| _version_ | 1848777041884741632 |
|---|---|
| author | Sutjipto, Agus Geter Edy Takata, Masasuke |
| author_facet | Sutjipto, Agus Geter Edy Takata, Masasuke |
| author_sort | Sutjipto, Agus Geter Edy |
| building | IIUM Repository |
| collection | Online Access |
| description | This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of insulators under electron bombardment. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an insulator surface simultaneously. The distribution of electric field created by the surface charging can be developed by a simple model. The increase of electric field at the surface may exceed a critical value to experience a surface breakdown/optically-visible flashover. The insulation property is evaluated by measuring the period of charging/ electron bombardment, which is needed to initiate a treeing- formation (hereinafter time to flashover treeing/TTF). In this paper, under a 25 keV primary electron beam energy and for a magnification of 5000·, a 99.95% purity polycrystalline MgO specimen resulted in 7 min TTF. It was also observed that increasing the primary beam energy and the SEM’s magnification decreased the TTF. Therefore, at for a given energy and magnification, this method can be used to evaluate the insulation property of insulators under an electron beam environment. |
| first_indexed | 2025-11-14T14:39:41Z |
| format | Article |
| id | iium-8676 |
| institution | International Islamic University Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-14T14:39:41Z |
| publishDate | 2007 |
| publisher | Springer Science+Business Media |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | iium-86762012-04-06T07:38:53Z http://irep.iium.edu.my/8676/ The use of SEM to investigate the effect of an electron beam on the optically-visible flashover treeing of MgO ceramic Sutjipto, Agus Geter Edy Takata, Masasuke TA401 Materials of engineering and construction This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of insulators under electron bombardment. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an insulator surface simultaneously. The distribution of electric field created by the surface charging can be developed by a simple model. The increase of electric field at the surface may exceed a critical value to experience a surface breakdown/optically-visible flashover. The insulation property is evaluated by measuring the period of charging/ electron bombardment, which is needed to initiate a treeing- formation (hereinafter time to flashover treeing/TTF). In this paper, under a 25 keV primary electron beam energy and for a magnification of 5000·, a 99.95% purity polycrystalline MgO specimen resulted in 7 min TTF. It was also observed that increasing the primary beam energy and the SEM’s magnification decreased the TTF. Therefore, at for a given energy and magnification, this method can be used to evaluate the insulation property of insulators under an electron beam environment. Springer Science+Business Media 2007-04-06 Article PeerReviewed application/pdf en http://irep.iium.edu.my/8676/1/AGUS_-_Journal_of_Materials_Science_2007.pdf Sutjipto, Agus Geter Edy and Takata, Masasuke (2007) The use of SEM to investigate the effect of an electron beam on the optically-visible flashover treeing of MgO ceramic. Journal of Materials Science, 42. pp. 6036-6040. ISSN 1573-4803 (O), 0022-2461 (P) |
| spellingShingle | TA401 Materials of engineering and construction Sutjipto, Agus Geter Edy Takata, Masasuke The use of SEM to investigate the effect of an electron beam on the optically-visible flashover treeing of MgO ceramic |
| title | The use of SEM to investigate the effect of an electron beam
on the optically-visible flashover treeing of MgO ceramic |
| title_full | The use of SEM to investigate the effect of an electron beam
on the optically-visible flashover treeing of MgO ceramic |
| title_fullStr | The use of SEM to investigate the effect of an electron beam
on the optically-visible flashover treeing of MgO ceramic |
| title_full_unstemmed | The use of SEM to investigate the effect of an electron beam
on the optically-visible flashover treeing of MgO ceramic |
| title_short | The use of SEM to investigate the effect of an electron beam
on the optically-visible flashover treeing of MgO ceramic |
| title_sort | use of sem to investigate the effect of an electron beam
on the optically-visible flashover treeing of mgo ceramic |
| topic | TA401 Materials of engineering and construction |
| url | http://irep.iium.edu.my/8676/ http://irep.iium.edu.my/8676/1/AGUS_-_Journal_of_Materials_Science_2007.pdf |