Optimum KOH wet etching of cantilever tip for better image captured by nanoeducator

The development of the various scanning probe microscopy techniques has revolutionized the study of surface structure up to atomic scale. Among these techniques, Nanoeducator as scanning force microscope or SFM has been developed to allow the accomplishment of various measuring techniques both fo...

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Main Authors: Edy Sutjipto, Agus Geter, Faris, Waleed Fekry, Adesta, Erry Yulian Triblas, Hanim, Hafizah
Format: Article
Language:English
Published: Trans Tech Publications Ltd., Switzerland 2011
Subjects:
Online Access:http://irep.iium.edu.my/8575/
http://irep.iium.edu.my/8575/1/AGUS_-_Applied_Mechanics_and_Materials_2011_-_Nanoeducator.pdf
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author Edy Sutjipto, Agus Geter
Faris, Waleed Fekry
Adesta, Erry Yulian Triblas
Hanim, Hafizah
author_facet Edy Sutjipto, Agus Geter
Faris, Waleed Fekry
Adesta, Erry Yulian Triblas
Hanim, Hafizah
author_sort Edy Sutjipto, Agus Geter
building IIUM Repository
collection Online Access
description The development of the various scanning probe microscopy techniques has revolutionized the study of surface structure up to atomic scale. Among these techniques, Nanoeducator as scanning force microscope or SFM has been developed to allow the accomplishment of various measuring techniques both for scanning tunneling microscope (STM) and non-contact atomic force microscope (AFM). However, there is no exact guidance how to fabricate cantilever to gather the good image. In order to achieve the better cantilever for students, this paper emphasizes on tip’s processing by altering etching length parameter as tip plays an important role to achieve better quality image during scanning operation. This paper also provides a guide for undergraduate student to know better about this machine as well as the principle behind it for them to acquire better quality image for their works. It was found that the number of turning of tungsten and etching time could produce good tip of cantilever. It is recommended for lecturers, students and technician to consider about turning and time of etching to produce a better tip of cantilever in Nanoeducator.
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institution International Islamic University Malaysia
institution_category Local University
language English
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publishDate 2011
publisher Trans Tech Publications Ltd., Switzerland
recordtype eprints
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spelling iium-85752011-12-09T06:14:28Z http://irep.iium.edu.my/8575/ Optimum KOH wet etching of cantilever tip for better image captured by nanoeducator Edy Sutjipto, Agus Geter Faris, Waleed Fekry Adesta, Erry Yulian Triblas Hanim, Hafizah TA401 Materials of engineering and construction The development of the various scanning probe microscopy techniques has revolutionized the study of surface structure up to atomic scale. Among these techniques, Nanoeducator as scanning force microscope or SFM has been developed to allow the accomplishment of various measuring techniques both for scanning tunneling microscope (STM) and non-contact atomic force microscope (AFM). However, there is no exact guidance how to fabricate cantilever to gather the good image. In order to achieve the better cantilever for students, this paper emphasizes on tip’s processing by altering etching length parameter as tip plays an important role to achieve better quality image during scanning operation. This paper also provides a guide for undergraduate student to know better about this machine as well as the principle behind it for them to acquire better quality image for their works. It was found that the number of turning of tungsten and etching time could produce good tip of cantilever. It is recommended for lecturers, students and technician to consider about turning and time of etching to produce a better tip of cantilever in Nanoeducator. Trans Tech Publications Ltd., Switzerland 2011-08-08 Article PeerReviewed application/pdf en http://irep.iium.edu.my/8575/1/AGUS_-_Applied_Mechanics_and_Materials_2011_-_Nanoeducator.pdf Edy Sutjipto, Agus Geter and Faris, Waleed Fekry and Adesta, Erry Yulian Triblas and Hanim, Hafizah (2011) Optimum KOH wet etching of cantilever tip for better image captured by nanoeducator. Applied Mechanics and Materials, 84-85. pp. 392-395. ISSN 1660-9336 http://www.scientific.net/AMM.84-85.392 10.4028/www.scientific.net/AMM.84-85.392
spellingShingle TA401 Materials of engineering and construction
Edy Sutjipto, Agus Geter
Faris, Waleed Fekry
Adesta, Erry Yulian Triblas
Hanim, Hafizah
Optimum KOH wet etching of cantilever tip for better image captured by nanoeducator
title Optimum KOH wet etching of cantilever tip for better image captured by nanoeducator
title_full Optimum KOH wet etching of cantilever tip for better image captured by nanoeducator
title_fullStr Optimum KOH wet etching of cantilever tip for better image captured by nanoeducator
title_full_unstemmed Optimum KOH wet etching of cantilever tip for better image captured by nanoeducator
title_short Optimum KOH wet etching of cantilever tip for better image captured by nanoeducator
title_sort optimum koh wet etching of cantilever tip for better image captured by nanoeducator
topic TA401 Materials of engineering and construction
url http://irep.iium.edu.my/8575/
http://irep.iium.edu.my/8575/
http://irep.iium.edu.my/8575/
http://irep.iium.edu.my/8575/1/AGUS_-_Applied_Mechanics_and_Materials_2011_-_Nanoeducator.pdf