Fuzzy based technique for microchip lead inspection using machine vision
This research develops a fuzzy based algorithm for microchip image lead Inspection. Leads are inspected for count, planarity, offset, pitch and span defects. Firstly, it utilizes fast preprocessing techniques and blobs’ features extraction methods to achieve high inspection rates. Using the fea...
| Main Authors: | , , |
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| Format: | Proceeding Paper |
| Language: | English |
| Published: |
2008
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/6952/ http://irep.iium.edu.my/6952/1/Fuzzy_Based_Technique_for_Microchip_Lead_Inspection_Using_Machine_Vision.pdf |
| _version_ | 1848776755901366272 |
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| author | Hawari, Yasser Salami, Momoh Jimoh Emiyoka Aburas, Abdurazzag Ali |
| author_facet | Hawari, Yasser Salami, Momoh Jimoh Emiyoka Aburas, Abdurazzag Ali |
| author_sort | Hawari, Yasser |
| building | IIUM Repository |
| collection | Online Access |
| description | This research develops a fuzzy based algorithm for
microchip image lead Inspection. Leads are inspected
for count, planarity, offset, pitch and span defects.
Firstly, it utilizes fast preprocessing techniques and
blobs’ features extraction methods to achieve high
inspection rates. Using the features extracted, the
algorithm first finds a proper thresholding value. It
then applies Fuzzy logic to make a decision on the
status of the IC based on these features. The algorithm
proposes a structured way for building the fuzzy
systems as well as the associated set of inference rules. |
| first_indexed | 2025-11-14T14:35:08Z |
| format | Proceeding Paper |
| id | iium-6952 |
| institution | International Islamic University Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-14T14:35:08Z |
| publishDate | 2008 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | iium-69522012-08-09T03:19:12Z http://irep.iium.edu.my/6952/ Fuzzy based technique for microchip lead inspection using machine vision Hawari, Yasser Salami, Momoh Jimoh Emiyoka Aburas, Abdurazzag Ali T Technology (General) This research develops a fuzzy based algorithm for microchip image lead Inspection. Leads are inspected for count, planarity, offset, pitch and span defects. Firstly, it utilizes fast preprocessing techniques and blobs’ features extraction methods to achieve high inspection rates. Using the features extracted, the algorithm first finds a proper thresholding value. It then applies Fuzzy logic to make a decision on the status of the IC based on these features. The algorithm proposes a structured way for building the fuzzy systems as well as the associated set of inference rules. 2008 Proceeding Paper PeerReviewed application/pdf en http://irep.iium.edu.my/6952/1/Fuzzy_Based_Technique_for_Microchip_Lead_Inspection_Using_Machine_Vision.pdf Hawari, Yasser and Salami, Momoh Jimoh Emiyoka and Aburas, Abdurazzag Ali (2008) Fuzzy based technique for microchip lead inspection using machine vision. In: International Conference on Computer and Communication Engineering 2008, 13 -15 May 2008 , Kuala Lumpur, Malaysia. |
| spellingShingle | T Technology (General) Hawari, Yasser Salami, Momoh Jimoh Emiyoka Aburas, Abdurazzag Ali Fuzzy based technique for microchip lead inspection using machine vision |
| title | Fuzzy based technique for microchip lead inspection using machine vision |
| title_full | Fuzzy based technique for microchip lead inspection using machine vision |
| title_fullStr | Fuzzy based technique for microchip lead inspection using machine vision |
| title_full_unstemmed | Fuzzy based technique for microchip lead inspection using machine vision |
| title_short | Fuzzy based technique for microchip lead inspection using machine vision |
| title_sort | fuzzy based technique for microchip lead inspection using machine vision |
| topic | T Technology (General) |
| url | http://irep.iium.edu.my/6952/ http://irep.iium.edu.my/6952/1/Fuzzy_Based_Technique_for_Microchip_Lead_Inspection_Using_Machine_Vision.pdf |