Fuzzy based technique for microchip lead inspection using machine vision

This research develops a fuzzy based algorithm for microchip image lead Inspection. Leads are inspected for count, planarity, offset, pitch and span defects. Firstly, it utilizes fast preprocessing techniques and blobs’ features extraction methods to achieve high inspection rates. Using the fea...

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Main Authors: Hawari, Yasser, Salami, Momoh Jimoh Emiyoka, Aburas, Abdurazzag Ali
Format: Proceeding Paper
Language:English
Published: 2008
Subjects:
Online Access:http://irep.iium.edu.my/6952/
http://irep.iium.edu.my/6952/1/Fuzzy_Based_Technique_for_Microchip_Lead_Inspection_Using_Machine_Vision.pdf
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author Hawari, Yasser
Salami, Momoh Jimoh Emiyoka
Aburas, Abdurazzag Ali
author_facet Hawari, Yasser
Salami, Momoh Jimoh Emiyoka
Aburas, Abdurazzag Ali
author_sort Hawari, Yasser
building IIUM Repository
collection Online Access
description This research develops a fuzzy based algorithm for microchip image lead Inspection. Leads are inspected for count, planarity, offset, pitch and span defects. Firstly, it utilizes fast preprocessing techniques and blobs’ features extraction methods to achieve high inspection rates. Using the features extracted, the algorithm first finds a proper thresholding value. It then applies Fuzzy logic to make a decision on the status of the IC based on these features. The algorithm proposes a structured way for building the fuzzy systems as well as the associated set of inference rules.
first_indexed 2025-11-14T14:35:08Z
format Proceeding Paper
id iium-6952
institution International Islamic University Malaysia
institution_category Local University
language English
last_indexed 2025-11-14T14:35:08Z
publishDate 2008
recordtype eprints
repository_type Digital Repository
spelling iium-69522012-08-09T03:19:12Z http://irep.iium.edu.my/6952/ Fuzzy based technique for microchip lead inspection using machine vision Hawari, Yasser Salami, Momoh Jimoh Emiyoka Aburas, Abdurazzag Ali T Technology (General) This research develops a fuzzy based algorithm for microchip image lead Inspection. Leads are inspected for count, planarity, offset, pitch and span defects. Firstly, it utilizes fast preprocessing techniques and blobs’ features extraction methods to achieve high inspection rates. Using the features extracted, the algorithm first finds a proper thresholding value. It then applies Fuzzy logic to make a decision on the status of the IC based on these features. The algorithm proposes a structured way for building the fuzzy systems as well as the associated set of inference rules. 2008 Proceeding Paper PeerReviewed application/pdf en http://irep.iium.edu.my/6952/1/Fuzzy_Based_Technique_for_Microchip_Lead_Inspection_Using_Machine_Vision.pdf Hawari, Yasser and Salami, Momoh Jimoh Emiyoka and Aburas, Abdurazzag Ali (2008) Fuzzy based technique for microchip lead inspection using machine vision. In: International Conference on Computer and Communication Engineering 2008, 13 -15 May 2008 , Kuala Lumpur, Malaysia.
spellingShingle T Technology (General)
Hawari, Yasser
Salami, Momoh Jimoh Emiyoka
Aburas, Abdurazzag Ali
Fuzzy based technique for microchip lead inspection using machine vision
title Fuzzy based technique for microchip lead inspection using machine vision
title_full Fuzzy based technique for microchip lead inspection using machine vision
title_fullStr Fuzzy based technique for microchip lead inspection using machine vision
title_full_unstemmed Fuzzy based technique for microchip lead inspection using machine vision
title_short Fuzzy based technique for microchip lead inspection using machine vision
title_sort fuzzy based technique for microchip lead inspection using machine vision
topic T Technology (General)
url http://irep.iium.edu.my/6952/
http://irep.iium.edu.my/6952/1/Fuzzy_Based_Technique_for_Microchip_Lead_Inspection_Using_Machine_Vision.pdf