An effective vision technique for microchip lead inspection

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An effective vision technique for microchip lead inspection

A new effective method for the microchip lead inspection for the chip manufacturing industry has been developed in this work. In contrast to the gray scale pattern matching technique this approach employs selected parameters of binary blobs to perform fault detection and measurements. This lead...

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Bibliographic Details
Main Authors:	Mir-Nassiri, Nazim, Al-Obaidy, Haitham H.L, Salami, Momoh Jimoh Eyiomika, Amin, Shamsuddin
Format:	Proceeding Paper
Language:	English
Published:	2003
Subjects:	T Technology (General)
Online Access:	http://irep.iium.edu.my/6943/ http://irep.iium.edu.my/6943/1/An_Effective_Vision_Technique_for_Microchip_Lead_Inspection.pdf

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