Gain investigation for commercial GaAs and SiGe HBT LNA's under electron irradiation
In this paper, a characterization and comparison between the effects of Electron irradiation on low noise amplifiers (LNAs) implemented in a Silicon-Germanium (SiGe) Heterojunction Bipolar Transistor (HBT) and Gallium-Arsenide (GaAs) HBT technologies, respectively, was carried out. Previous studies...
| Main Authors: | Youssouf, Abdouraouf S., Habaebi, Mohamed Hadi, Ibrahim, S.Noorjannah, Hasbullah, Nurul Fadzlin |
|---|---|
| Format: | Proceeding Paper |
| Language: | English English English |
| Published: |
IEEE
2017
|
| Subjects: | |
| Online Access: | http://irep.iium.edu.my/54043/ http://irep.iium.edu.my/54043/14/54043-edited.pdf http://irep.iium.edu.my/54043/20/54043-Gain%20investigation%20for%20commercial%20GaAs%20and%20SiGe%20HBT%20LNA%27s%20under%20electron%20irradiation_SCOPUS.pdf http://irep.iium.edu.my/54043/26/54043_wos.pdf |
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