Single-event Transient (SET) effects on 60nm and 32nm 3T CMOS active pixel sensor

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Single-event Transient (SET) effects on 60nm and 32nm 3T CMOS active pixel sensor

Nowadays, CMOS Active Pixel Sensors (APS) are widely used especially in space mission. However, the space consists of various kind of radiation. Single-Event Transient (SET) is one of the concern for the circuits in the radiation environment. SETs are becoming a common phenomenon with technology...

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Bibliographic Details
Main Authors:	Ahamad Sukor, Masturah, Hasbullah, Nurul Fadzlin, Ibrahim, Siti Noorjannah
Format:	Proceeding Paper
Language:	English
Published:	Penerbit UMT, Universiti Malaysia Terengganu (UMT) 2016
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://irep.iium.edu.my/53222/ http://irep.iium.edu.my/53222/1/53222_Single-event%20transient%20%28SET%29.pdf

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