Improvement of accuracy and speed of a commercial AFM using Positive Position Feedback control

Improvement of accuracy and speed of a commercial AFM using Positive Position Feedback control

The atomic force microscope (AFM) is a device capable of generating topographic images of sample surfaces with extremely high resolutions down to the atomic level. It is also being used in applications that involve manipulation of matter at a nanoscale. Early AFMs were operated in open loop. As a re...

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Bibliographic Details
Main Authors: Mahmood, Iskandar Al-Thani, Moheimani, S.O. Reza
Format: Proceeding Paper
Language:English
Published: 2009
Subjects:
Q Science (General)
TJ212 Control engineering
Online Access:http://irep.iium.edu.my/5305/
http://irep.iium.edu.my/5305/1/Improvement_of_accuracy_and_speed_of_a_commercial_AFM_using_positive_position_feedback_control.pdf

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