Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes

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Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes

A spiral scanning method for high-speed Atomic Force Microscopy (AFM) is described in this paper. In this method, the sample is scanned in a spiral pattern instead of the conventional raster pattern. A spiral scan can be produced by applying single frequency cosine and sine signals with slowly varyi...

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Bibliographic Details
Main Authors:	Mahmood, Iskandar Al-Thani, Moheimani, S.O. Reza
Format:	Proceeding Paper
Language:	English
Published:	2010
Subjects:	Q Science (General) TJ212 Control engineering
Online Access:	http://irep.iium.edu.my/5304/ http://irep.iium.edu.my/5304/1/Spiral_scanning_-_An_alternative_to_conventional_raster_scanning_in_high-speed_Scanning_Probe_Microscopes.pdf

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