Spiral-scan atomic force microscopy: a constant linear velocity approach

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Spiral-scan atomic force microscopy: a constant linear velocity approach

This paper describes an alternative method to the widely-used raster-scan technique for Atomic Force Microscopy (AFM). In this method, the sample is scanned in a spiral pattern instead of the well established raster trajectory. A spiral pattern is produced by applying cosine and sine signals with sl...

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Bibliographic Details
Main Authors:	Mahmood, Iskandar Al-Thani, Moheimani, S.O. Reza
Format:	Proceeding Paper
Language:	English
Published:	2010
Subjects:	Q Science (General) TJ212 Control engineering
Online Access:	http://irep.iium.edu.my/5303/ http://irep.iium.edu.my/5303/4/Spiral-Scan_Atomic_Force_Microscopy_A_Constant_Linear_Velocity_Approach.pdf

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