Spiral-scan atomic force microscopy: a constant linear velocity approach
This paper describes an alternative method to the widely-used raster-scan technique for Atomic Force Microscopy (AFM). In this method, the sample is scanned in a spiral pattern instead of the well established raster trajectory. A spiral pattern is produced by applying cosine and sine signals with sl...
| Main Authors: | , |
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| Format: | Proceeding Paper |
| Language: | English |
| Published: |
2010
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| Online Access: | http://irep.iium.edu.my/5303/ http://irep.iium.edu.my/5303/4/Spiral-Scan_Atomic_Force_Microscopy_A_Constant_Linear_Velocity_Approach.pdf |
| _version_ | 1848776476768337920 |
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| author | Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza |
| author_facet | Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza |
| author_sort | Mahmood, Iskandar Al-Thani |
| building | IIUM Repository |
| collection | Online Access |
| description | This paper describes an alternative method to the widely-used raster-scan technique for Atomic Force Microscopy (AFM). In this method, the sample is scanned in a spiral pattern instead of the well established raster trajectory. A spiral pattern is produced by applying cosine and sine signals with slowly varying amplitudes to the x-axis and y-axis of an AFM scanner respectively. In order to ensure that the spiral trajectory travels at a constant linear velocity (CLV), frequency and amplitude of the input signals are varied simultaneously in a way that the linear velocity of the scanner is kept constant. Experimental results obtained by implementing the CLV spiral scan on a commercial AFM indicate that, compared with the raster-scan method, high-quality AFM images of equal area and pitch can be generated two times faster and using half of the total traveled distance. |
| first_indexed | 2025-11-14T14:30:42Z |
| format | Proceeding Paper |
| id | iium-5303 |
| institution | International Islamic University Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-14T14:30:42Z |
| publishDate | 2010 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | iium-53032011-11-01T01:19:26Z http://irep.iium.edu.my/5303/ Spiral-scan atomic force microscopy: a constant linear velocity approach Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza Q Science (General) TJ212 Control engineering This paper describes an alternative method to the widely-used raster-scan technique for Atomic Force Microscopy (AFM). In this method, the sample is scanned in a spiral pattern instead of the well established raster trajectory. A spiral pattern is produced by applying cosine and sine signals with slowly varying amplitudes to the x-axis and y-axis of an AFM scanner respectively. In order to ensure that the spiral trajectory travels at a constant linear velocity (CLV), frequency and amplitude of the input signals are varied simultaneously in a way that the linear velocity of the scanner is kept constant. Experimental results obtained by implementing the CLV spiral scan on a commercial AFM indicate that, compared with the raster-scan method, high-quality AFM images of equal area and pitch can be generated two times faster and using half of the total traveled distance. 2010-08 Proceeding Paper PeerReviewed application/pdf en http://irep.iium.edu.my/5303/4/Spiral-Scan_Atomic_Force_Microscopy_A_Constant_Linear_Velocity_Approach.pdf Mahmood, Iskandar Al-Thani and Moheimani, S.O. Reza (2010) Spiral-scan atomic force microscopy: a constant linear velocity approach. In: 10th IEEE International Conference on Nanotechnology Joint Symposium with Nano Korea, 17 - 20 August 2010, KINTEX, Korea. |
| spellingShingle | Q Science (General) TJ212 Control engineering Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza Spiral-scan atomic force microscopy: a constant linear velocity approach |
| title | Spiral-scan atomic force microscopy: a constant linear velocity approach |
| title_full | Spiral-scan atomic force microscopy: a constant linear velocity approach |
| title_fullStr | Spiral-scan atomic force microscopy: a constant linear velocity approach |
| title_full_unstemmed | Spiral-scan atomic force microscopy: a constant linear velocity approach |
| title_short | Spiral-scan atomic force microscopy: a constant linear velocity approach |
| title_sort | spiral-scan atomic force microscopy: a constant linear velocity approach |
| topic | Q Science (General) TJ212 Control engineering |
| url | http://irep.iium.edu.my/5303/ http://irep.iium.edu.my/5303/4/Spiral-Scan_Atomic_Force_Microscopy_A_Constant_Linear_Velocity_Approach.pdf |