Making a commercial atomic force microscope more accurate and faster using positive position feedback control

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Making a commercial atomic force microscope more accurate and faster using positive position feedback control

This paper presents experimental implementation of a positive position feedback (PPF) control scheme for vibration and cross-coupling compensation of a piezoelectric tube scanner in a commercial atomic force microscope (AFM). The AFM is a device capable of generating images with extremely high resol...

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Bibliographic Details
Main Authors:	Mahmood, Iskandar Al-Thani, Moheimani, S.O. Reza
Format:	Article
Language:	English
Published:	American Institute of Physics (AIP) 2009
Subjects:	Q Science (General) TJ212 Control engineering
Online Access:	http://irep.iium.edu.my/5202/ http://irep.iium.edu.my/5202/1/Making_a_commercial_atomic_force_microscope_more_accurate_and_faster_using_positive_position_feedback_control.pdf

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