Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT

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Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT

A new approach for defect classification and quantification by using pulsed eddy current sensors and integration of principal component analysis and wavelet transform for feature based signal interpretation is presented. After reviewing the limitation of current parameters of peak value and its arri...

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Bibliographic Details
Main Authors:	Tian, G.Y., Sophian, Ali, Taylor, D., Rudlin, J.
Format:	Article
Language:	English
Published:	Institute of Electrical Engineers 2005
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://irep.iium.edu.my/47012/ http://irep.iium.edu.my/47012/1/iet_Wavelet-based_PCA_defect_classification.pdf

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