Mitigation of WIP-related problems at an IC production line through a suitable inspection sampling plan

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Mitigation of WIP-related problems at an IC production line through a suitable inspection sampling plan

Unpredictable work-in-process (WIP) inventory developed in the inspection area of an integrated circuit (IC) assembly line due to the acceptance criteria dictated by a single sampling plan often requires additional human resources and results in longer production lead time. Sudden need of additional...

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Bibliographic Details
Main Authors:	Karim, A.N. Mustafizul, Abd. Rahman, Mohamed, Hj. Yusop, Nornilawati
Format:	Proceeding Paper
Language:	English English
Published:	2014
Subjects:	TS Manufactures
Online Access:	http://irep.iium.edu.my/40562/ http://irep.iium.edu.my/40562/1/MITIGATION_OF_WIP-RELATED_PROBLEMS.pdf http://irep.iium.edu.my/40562/4/40562.pdf

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