A modular system of deep level transient spectroscopy

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A modular system of deep level transient spectroscopy

Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequenc...

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Bibliographic Details
Main Authors:	Rusli, Nazreen, Debuf, Didier
Format:	Proceeding Paper
Language:	English
Published:	2011
Subjects:	QC Physics
Online Access:	http://irep.iium.edu.my/36427/ http://irep.iium.edu.my/36427/1/iccaie.pdf

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