A modular system of deep level transient spectroscopy
Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequenc...
| Main Authors: | , |
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| Format: | Proceeding Paper |
| Language: | English |
| Published: |
2011
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| Online Access: | http://irep.iium.edu.my/36427/ http://irep.iium.edu.my/36427/1/iccaie.pdf |
| _version_ | 1848781227664867328 |
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| author | Rusli, Nazreen Debuf, Didier |
| author_facet | Rusli, Nazreen Debuf, Didier |
| author_sort | Rusli, Nazreen |
| building | IIUM Repository |
| collection | Online Access |
| description | Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequency Deep Level Transient Spectroscopy (FFDLTS) is proposed as one of the methods to analyze the defect level depth. |
| first_indexed | 2025-11-14T15:46:13Z |
| format | Proceeding Paper |
| id | iium-36427 |
| institution | International Islamic University Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-14T15:46:13Z |
| publishDate | 2011 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | iium-364272014-04-25T07:30:30Z http://irep.iium.edu.my/36427/ A modular system of deep level transient spectroscopy Rusli, Nazreen Debuf, Didier QC Physics Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequency Deep Level Transient Spectroscopy (FFDLTS) is proposed as one of the methods to analyze the defect level depth. 2011-12-04 Proceeding Paper PeerReviewed application/pdf en http://irep.iium.edu.my/36427/1/iccaie.pdf Rusli, Nazreen and Debuf, Didier (2011) A modular system of deep level transient spectroscopy. In: 2011 IEEE International Conference on Computer Applications and Industrial Electronics (ICCAIE 2011), 4-7 Dec. 2011, Penang. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6162137&tag=1 |
| spellingShingle | QC Physics Rusli, Nazreen Debuf, Didier A modular system of deep level transient spectroscopy |
| title | A modular system of deep level transient spectroscopy |
| title_full | A modular system of deep level transient spectroscopy |
| title_fullStr | A modular system of deep level transient spectroscopy |
| title_full_unstemmed | A modular system of deep level transient spectroscopy |
| title_short | A modular system of deep level transient spectroscopy |
| title_sort | modular system of deep level transient spectroscopy |
| topic | QC Physics |
| url | http://irep.iium.edu.my/36427/ http://irep.iium.edu.my/36427/ http://irep.iium.edu.my/36427/1/iccaie.pdf |