Development and optimization of High-Hertz stress contact to reduce future contact material cost

Reducing a total contact material cost of a connector, a high-Hertz stress with low normal force (LNF) contact will be a key technology in the future. Only an R5m tip with 0.1N force contact provides an excellent electrical performance which is much sharper than conventional connectors. 0.30 millio...

Full description

Bibliographic Details
Main Author: Bhuiyan, Moinul
Format: Proceeding Paper
Language:English
English
Published: 2010
Subjects:
Online Access:http://irep.iium.edu.my/33189/
http://irep.iium.edu.my/33189/1/Development_and_Optimization_of_High-Hertz_Stress_Contact_to_Reduce_Future_Contact_Material_Cost.pdf
http://irep.iium.edu.my/33189/4/TE_Technical_Conference_2010.jpg
_version_ 1848780702990991360
author Bhuiyan, Moinul
author_facet Bhuiyan, Moinul
author_sort Bhuiyan, Moinul
building IIUM Repository
collection Online Access
description Reducing a total contact material cost of a connector, a high-Hertz stress with low normal force (LNF) contact will be a key technology in the future. Only an R5m tip with 0.1N force contact provides an excellent electrical performance which is much sharper than conventional connectors. 0.30 million cycles durability test was passed and the contact resistance was ≦50m-ohm.
first_indexed 2025-11-14T15:37:53Z
format Proceeding Paper
id iium-33189
institution International Islamic University Malaysia
institution_category Local University
language English
English
last_indexed 2025-11-14T15:37:53Z
publishDate 2010
recordtype eprints
repository_type Digital Repository
spelling iium-331892013-12-20T07:21:21Z http://irep.iium.edu.my/33189/ Development and optimization of High-Hertz stress contact to reduce future contact material cost Bhuiyan, Moinul TA401 Materials of engineering and construction Reducing a total contact material cost of a connector, a high-Hertz stress with low normal force (LNF) contact will be a key technology in the future. Only an R5m tip with 0.1N force contact provides an excellent electrical performance which is much sharper than conventional connectors. 0.30 million cycles durability test was passed and the contact resistance was ≦50m-ohm. 2010-10-20 Proceeding Paper PeerReviewed application/pdf en http://irep.iium.edu.my/33189/1/Development_and_Optimization_of_High-Hertz_Stress_Contact_to_Reduce_Future_Contact_Material_Cost.pdf application/pdf en http://irep.iium.edu.my/33189/4/TE_Technical_Conference_2010.jpg Bhuiyan, Moinul (2010) Development and optimization of High-Hertz stress contact to reduce future contact material cost. In: Tyco Electronics Technical Conference 2010, 18-20 October 2010, San Jose, USA. (Unpublished) http://www.te.com/en/home.html
spellingShingle TA401 Materials of engineering and construction
Bhuiyan, Moinul
Development and optimization of High-Hertz stress contact to reduce future contact material cost
title Development and optimization of High-Hertz stress contact to reduce future contact material cost
title_full Development and optimization of High-Hertz stress contact to reduce future contact material cost
title_fullStr Development and optimization of High-Hertz stress contact to reduce future contact material cost
title_full_unstemmed Development and optimization of High-Hertz stress contact to reduce future contact material cost
title_short Development and optimization of High-Hertz stress contact to reduce future contact material cost
title_sort development and optimization of high-hertz stress contact to reduce future contact material cost
topic TA401 Materials of engineering and construction
url http://irep.iium.edu.my/33189/
http://irep.iium.edu.my/33189/
http://irep.iium.edu.my/33189/1/Development_and_Optimization_of_High-Hertz_Stress_Contact_to_Reduce_Future_Contact_Material_Cost.pdf
http://irep.iium.edu.my/33189/4/TE_Technical_Conference_2010.jpg