Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy
Piezoelectric tube scanner is a major component that used in nanoscale imaging tools such as atomic force microscopy (AFM). This is because it can provide precise nanoscale positioning. However the precision is limited by vibration and some nonlinear drawbacks represented by creep and hysteresis. Hy...
| Main Authors: | , , , |
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| Format: | Proceeding Paper |
| Language: | English |
| Published: |
2012
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| Online Access: | http://irep.iium.edu.my/32299/ http://irep.iium.edu.my/32299/1/Artificial_Neural_Network_Based_Hysteresis_Compensation_for_Piezoelectric_Tube_Scanner_in_Atomic_Force_Microscopy.pdf |
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| author | Othman, Yahya Sheriff Mahmood, Iskandar Al-Thani Alang Md Rashid, Nahrul Khair Darsivan, Fadly Jashi |
| author_facet | Othman, Yahya Sheriff Mahmood, Iskandar Al-Thani Alang Md Rashid, Nahrul Khair Darsivan, Fadly Jashi |
| author_sort | Othman, Yahya Sheriff |
| building | IIUM Repository |
| collection | Online Access |
| description | Piezoelectric tube scanner is a major component that used in nanoscale imaging tools such as atomic force microscopy (AFM). This is because it can provide precise nanoscale positioning. However the precision is limited by vibration and some nonlinear drawbacks represented by creep and hysteresis. Hysteresis problem appears when positioning is needed at wide range. In this paper, a feed forward multi-layer neural network (MLNN) is trained to shape a proper control signal based on reference input and actual output signals. The experimental results show that the developed neural network scheme improves the performance of the system by significantly minimizing the effect of hysteresis. |
| first_indexed | 2025-11-14T15:35:15Z |
| format | Proceeding Paper |
| id | iium-32299 |
| institution | International Islamic University Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-14T15:35:15Z |
| publishDate | 2012 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | iium-322992013-10-11T07:26:44Z http://irep.iium.edu.my/32299/ Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy Othman, Yahya Sheriff Mahmood, Iskandar Al-Thani Alang Md Rashid, Nahrul Khair Darsivan, Fadly Jashi TJ212 Control engineering Piezoelectric tube scanner is a major component that used in nanoscale imaging tools such as atomic force microscopy (AFM). This is because it can provide precise nanoscale positioning. However the precision is limited by vibration and some nonlinear drawbacks represented by creep and hysteresis. Hysteresis problem appears when positioning is needed at wide range. In this paper, a feed forward multi-layer neural network (MLNN) is trained to shape a proper control signal based on reference input and actual output signals. The experimental results show that the developed neural network scheme improves the performance of the system by significantly minimizing the effect of hysteresis. 2012 Proceeding Paper PeerReviewed application/pdf en http://irep.iium.edu.my/32299/1/Artificial_Neural_Network_Based_Hysteresis_Compensation_for_Piezoelectric_Tube_Scanner_in_Atomic_Force_Microscopy.pdf Othman, Yahya Sheriff and Mahmood, Iskandar Al-Thani and Alang Md Rashid, Nahrul Khair and Darsivan, Fadly Jashi (2012) Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy. In: TENCON 2012 - 2012 IEEE Region 10 Conference, 19-22 Nov 2012, Cebu, Philippines. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6412244&tag=1 |
| spellingShingle | TJ212 Control engineering Othman, Yahya Sheriff Mahmood, Iskandar Al-Thani Alang Md Rashid, Nahrul Khair Darsivan, Fadly Jashi Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy |
| title | Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy |
| title_full | Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy |
| title_fullStr | Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy |
| title_full_unstemmed | Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy |
| title_short | Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy |
| title_sort | artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy |
| topic | TJ212 Control engineering |
| url | http://irep.iium.edu.my/32299/ http://irep.iium.edu.my/32299/ http://irep.iium.edu.my/32299/1/Artificial_Neural_Network_Based_Hysteresis_Compensation_for_Piezoelectric_Tube_Scanner_in_Atomic_Force_Microscopy.pdf |