CMOS Op amp testing for capacitive measuring systems application
Operational amplifier (Op amp) is the most integral part of an embedded circuit building block. In this paper, the testing of an integrated Op amp suitable use for capacitance and high speed measuring system has been made. The Op amp testing (such as large signal differential transfer characteristic...
| Main Authors: | Arfah, Nurul, Alam, A. H. M. Zahirul, Khan, Sheroz |
|---|---|
| Format: | Proceeding Paper |
| Language: | English |
| Published: |
2011
|
| Subjects: | |
| Online Access: | http://irep.iium.edu.my/11860/ http://irep.iium.edu.my/11860/1/CMOS_Op_amp_testing_for_capacitive_measuring_systems_application.pdf |
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