CMOS Op amp testing for capacitive measuring systems application
Operational amplifier (Op amp) is the most integral part of an embedded circuit building block. In this paper, the testing of an integrated Op amp suitable use for capacitance and high speed measuring system has been made. The Op amp testing (such as large signal differential transfer characteristic...
| Main Authors: | , , |
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| Format: | Proceeding Paper |
| Language: | English |
| Published: |
2011
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/11860/ http://irep.iium.edu.my/11860/1/CMOS_Op_amp_testing_for_capacitive_measuring_systems_application.pdf |
| _version_ | 1848777371760459776 |
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| author | Arfah, Nurul Alam, A. H. M. Zahirul Khan, Sheroz |
| author_facet | Arfah, Nurul Alam, A. H. M. Zahirul Khan, Sheroz |
| author_sort | Arfah, Nurul |
| building | IIUM Repository |
| collection | Online Access |
| description | Operational amplifier (Op amp) is the most integral part of an embedded circuit building block. In this paper, the testing of an integrated Op amp suitable use for capacitance and high speed measuring system has been made. The Op amp testing (such as large signal differential transfer characteristic, frequency respond analysis, input common mode analysis, slew rate analysis) has been done using the PSpice OrCAD Version 16.0 circuit simulator and simulation results were compared with the design specification. The design of this Op amp for capacitive measuring system is making use of 0.13 μm complementary metal-oxide-semiconductor (CMOS) technology. This high speed and low power consumption system design is suitable use in a measuring system for detection a wide and lower range of capacitance. |
| first_indexed | 2025-11-14T14:44:56Z |
| format | Proceeding Paper |
| id | iium-11860 |
| institution | International Islamic University Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-14T14:44:56Z |
| publishDate | 2011 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | iium-118602021-01-14T01:36:00Z http://irep.iium.edu.my/11860/ CMOS Op amp testing for capacitive measuring systems application Arfah, Nurul Alam, A. H. M. Zahirul Khan, Sheroz TK Electrical engineering. Electronics Nuclear engineering Operational amplifier (Op amp) is the most integral part of an embedded circuit building block. In this paper, the testing of an integrated Op amp suitable use for capacitance and high speed measuring system has been made. The Op amp testing (such as large signal differential transfer characteristic, frequency respond analysis, input common mode analysis, slew rate analysis) has been done using the PSpice OrCAD Version 16.0 circuit simulator and simulation results were compared with the design specification. The design of this Op amp for capacitive measuring system is making use of 0.13 μm complementary metal-oxide-semiconductor (CMOS) technology. This high speed and low power consumption system design is suitable use in a measuring system for detection a wide and lower range of capacitance. 2011-12-01 Proceeding Paper PeerReviewed application/pdf en http://irep.iium.edu.my/11860/1/CMOS_Op_amp_testing_for_capacitive_measuring_systems_application.pdf Arfah, Nurul and Alam, A. H. M. Zahirul and Khan, Sheroz (2011) CMOS Op amp testing for capacitive measuring systems application. In: 2011 IEEE Regional Symposium on Micro and Nanoelectronics (RSM 2011), 28-30 September, Kota Kinabalu, Malaysia. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6088318 |
| spellingShingle | TK Electrical engineering. Electronics Nuclear engineering Arfah, Nurul Alam, A. H. M. Zahirul Khan, Sheroz CMOS Op amp testing for capacitive measuring systems application |
| title | CMOS Op amp testing for capacitive measuring systems application |
| title_full | CMOS Op amp testing for capacitive measuring systems application |
| title_fullStr | CMOS Op amp testing for capacitive measuring systems application |
| title_full_unstemmed | CMOS Op amp testing for capacitive measuring systems application |
| title_short | CMOS Op amp testing for capacitive measuring systems application |
| title_sort | cmos op amp testing for capacitive measuring systems application |
| topic | TK Electrical engineering. Electronics Nuclear engineering |
| url | http://irep.iium.edu.my/11860/ http://irep.iium.edu.my/11860/ http://irep.iium.edu.my/11860/1/CMOS_Op_amp_testing_for_capacitive_measuring_systems_application.pdf |