A simple approximation for forces exerted on an AFM tip in liquid

The critical quantity in understanding imaging using an atomic force microscope is the force the sample exerts on the tip. We put forward a simple one-to-one force to water density relationship, explain exactly how it occurs, and in which circumstances it holds. We argue that two wide classes of ato...

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Main Authors: Watkins, M., Reischl, Bernhard
Format: Journal Article
Published: AMER INST PHYSICS 2013
Online Access:http://hdl.handle.net/20.500.11937/9779
_version_ 1848746048352157696
author Watkins, M.
Reischl, Bernhard
author_facet Watkins, M.
Reischl, Bernhard
author_sort Watkins, M.
building Curtin Institutional Repository
collection Online Access
description The critical quantity in understanding imaging using an atomic force microscope is the force the sample exerts on the tip. We put forward a simple one-to-one force to water density relationship, explain exactly how it occurs, and in which circumstances it holds. We argue that two wide classes of atomic force microscope (AFM) tip should lead to at least qualitative agreement with our model and represent a significant fraction of AFM tips as currently prepared. This connection between the short-range force and the unperturbed equilibrium water density removes the need to perform simulations for each tip location, conservatively speeding up simulations by around three orders of magnitude compared to current methods that explicitly calculate the force on a tip model at each point in space. © 2013 AIP Publishing LLC.
first_indexed 2025-11-14T06:27:03Z
format Journal Article
id curtin-20.500.11937-9779
institution Curtin University Malaysia
institution_category Local University
last_indexed 2025-11-14T06:27:03Z
publishDate 2013
publisher AMER INST PHYSICS
recordtype eprints
repository_type Digital Repository
spelling curtin-20.500.11937-97792017-09-13T14:50:55Z A simple approximation for forces exerted on an AFM tip in liquid Watkins, M. Reischl, Bernhard The critical quantity in understanding imaging using an atomic force microscope is the force the sample exerts on the tip. We put forward a simple one-to-one force to water density relationship, explain exactly how it occurs, and in which circumstances it holds. We argue that two wide classes of atomic force microscope (AFM) tip should lead to at least qualitative agreement with our model and represent a significant fraction of AFM tips as currently prepared. This connection between the short-range force and the unperturbed equilibrium water density removes the need to perform simulations for each tip location, conservatively speeding up simulations by around three orders of magnitude compared to current methods that explicitly calculate the force on a tip model at each point in space. © 2013 AIP Publishing LLC. 2013 Journal Article http://hdl.handle.net/20.500.11937/9779 10.1063/1.4800770 AMER INST PHYSICS restricted
spellingShingle Watkins, M.
Reischl, Bernhard
A simple approximation for forces exerted on an AFM tip in liquid
title A simple approximation for forces exerted on an AFM tip in liquid
title_full A simple approximation for forces exerted on an AFM tip in liquid
title_fullStr A simple approximation for forces exerted on an AFM tip in liquid
title_full_unstemmed A simple approximation for forces exerted on an AFM tip in liquid
title_short A simple approximation for forces exerted on an AFM tip in liquid
title_sort simple approximation for forces exerted on an afm tip in liquid
url http://hdl.handle.net/20.500.11937/9779