Schottky Diode Leakage Current Fluctuations: Electrostatically Induced Flexoelectricity in Silicon
Nearly four decades have passed since IBM scientists pioneered atomic force microscopy (AFM) by merging the principles of a scanning tunneling microscope with the features of a stylus profilometer. Today, electrical AFM modes are an indispensable asset within the semiconductor and nanotechnology ind...
| Main Authors: | , , , |
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| Format: | Journal Article |
| Language: | English |
| Published: |
2024
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| Subjects: | |
| Online Access: | http://purl.org/au-research/grants/arc/DP220100553 http://hdl.handle.net/20.500.11937/95988 |
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