Vo, B., & Vo, B. (2019). A Multi-Scan Labeled Random Finite Set Model for Multi-Object State Estimation. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC.
Chicago Style (17th ed.) CitationVo, Ba-Ngu, and Ba-Tuong Vo. A Multi-Scan Labeled Random Finite Set Model for Multi-Object State Estimation. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2019.
MLA (9th ed.) CitationVo, Ba-Ngu, and Ba-Tuong Vo. A Multi-Scan Labeled Random Finite Set Model for Multi-Object State Estimation. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2019.
Warning: These citations may not always be 100% accurate.