A Measure of Well-Spread Points in Noise Wave-Based Source Matrix for Wideband Noise Parameter Measurement: The SKA-Low Example
The existence of a figure of merit for measuring the degree of well-spread source points in noise parameter extraction has long been conjectured. This article proposes a measure based on noise waves that is physically motivated and is directly connected to linear algebra through the matrix condition...
| Main Authors: | , , , |
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| Format: | Journal Article |
| Language: | English |
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IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2020
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| Online Access: | http://hdl.handle.net/20.500.11937/84207 |
| _version_ | 1848764623278309376 |
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| author | Sutinjo, Adrian Belostotski, L. Juswardy, Budi Ung, Daniel X.C. |
| author_facet | Sutinjo, Adrian Belostotski, L. Juswardy, Budi Ung, Daniel X.C. |
| author_sort | Sutinjo, Adrian |
| building | Curtin Institutional Repository |
| collection | Online Access |
| description | The existence of a figure of merit for measuring the degree of well-spread source points in noise parameter extraction has long been conjectured. This article proposes a measure based on noise waves that is physically motivated and is directly connected to linear algebra through the matrix condition number and/or determinant. The key to this figure of merit is the selection of the noise temperature equation and the removal of singularity due to the 1/(1-|\Gamma _{s}|^{2}) factor. The result is a well-scaled source matrix with entries bounded within a unit circle. We demonstrate the effectiveness of this measure by extracting the noise parameters of an amplifier in the low-frequency Square Kilometre Array (SKA-Low) band of 50-350 MHz using seven tuner positions. The noise parameters in the 50-100-MHz band are successfully measured despite being below the 100-MHz tuner rating. This outcome is very well predicted by the condition number and the determinant of the source matrix in question. |
| first_indexed | 2025-11-14T11:22:18Z |
| format | Journal Article |
| id | curtin-20.500.11937-84207 |
| institution | Curtin University Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-14T11:22:18Z |
| publishDate | 2020 |
| publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | curtin-20.500.11937-842072021-07-20T03:12:02Z A Measure of Well-Spread Points in Noise Wave-Based Source Matrix for Wideband Noise Parameter Measurement: The SKA-Low Example Sutinjo, Adrian Belostotski, L. Juswardy, Budi Ung, Daniel X.C. Science & Technology Technology Engineering, Electrical & Electronic Engineering Low-noise amplifiers (LNAs) noise measurements radio astronomy thermal noise ultra high frequency (UHF) circuits very high frequency (VHF) circuits IMPEDANCE-PATTERN DEVICE NOISE The existence of a figure of merit for measuring the degree of well-spread source points in noise parameter extraction has long been conjectured. This article proposes a measure based on noise waves that is physically motivated and is directly connected to linear algebra through the matrix condition number and/or determinant. The key to this figure of merit is the selection of the noise temperature equation and the removal of singularity due to the 1/(1-|\Gamma _{s}|^{2}) factor. The result is a well-scaled source matrix with entries bounded within a unit circle. We demonstrate the effectiveness of this measure by extracting the noise parameters of an amplifier in the low-frequency Square Kilometre Array (SKA-Low) band of 50-350 MHz using seven tuner positions. The noise parameters in the 50-100-MHz band are successfully measured despite being below the 100-MHz tuner rating. This outcome is very well predicted by the condition number and the determinant of the source matrix in question. 2020 Journal Article http://hdl.handle.net/20.500.11937/84207 10.1109/TMTT.2020.2977287 English IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC fulltext |
| spellingShingle | Science & Technology Technology Engineering, Electrical & Electronic Engineering Low-noise amplifiers (LNAs) noise measurements radio astronomy thermal noise ultra high frequency (UHF) circuits very high frequency (VHF) circuits IMPEDANCE-PATTERN DEVICE NOISE Sutinjo, Adrian Belostotski, L. Juswardy, Budi Ung, Daniel X.C. A Measure of Well-Spread Points in Noise Wave-Based Source Matrix for Wideband Noise Parameter Measurement: The SKA-Low Example |
| title | A Measure of Well-Spread Points in Noise Wave-Based Source Matrix for Wideband Noise Parameter Measurement: The SKA-Low Example |
| title_full | A Measure of Well-Spread Points in Noise Wave-Based Source Matrix for Wideband Noise Parameter Measurement: The SKA-Low Example |
| title_fullStr | A Measure of Well-Spread Points in Noise Wave-Based Source Matrix for Wideband Noise Parameter Measurement: The SKA-Low Example |
| title_full_unstemmed | A Measure of Well-Spread Points in Noise Wave-Based Source Matrix for Wideband Noise Parameter Measurement: The SKA-Low Example |
| title_short | A Measure of Well-Spread Points in Noise Wave-Based Source Matrix for Wideband Noise Parameter Measurement: The SKA-Low Example |
| title_sort | measure of well-spread points in noise wave-based source matrix for wideband noise parameter measurement: the ska-low example |
| topic | Science & Technology Technology Engineering, Electrical & Electronic Engineering Low-noise amplifiers (LNAs) noise measurements radio astronomy thermal noise ultra high frequency (UHF) circuits very high frequency (VHF) circuits IMPEDANCE-PATTERN DEVICE NOISE |
| url | http://hdl.handle.net/20.500.11937/84207 |