Genetic mapping using a wheat multi-founder population reveals a locus on chromosome 2A controlling resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum
The necrotrophic fungal pathogen Parastagonospora nodorum is the causal agent of Septoria nodorum leaf blotch and glume blotch, which are common wheat (Triticum aestivum L.) diseases in humid and temperate areas. Susceptibility to Septoria nodorum leaf blotch can partly be explained by sensitivity t...
| Main Authors: | , , , , , |
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| Format: | Journal Article |
| Language: | English |
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SPRINGER
2020
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| Online Access: | http://hdl.handle.net/20.500.11937/83210 |
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| author | Lin, M. Corsi, B. Ficke, A. Tan, Kar-Chun Cockram, J. Lillemo, M. |
| author_facet | Lin, M. Corsi, B. Ficke, A. Tan, Kar-Chun Cockram, J. Lillemo, M. |
| author_sort | Lin, M. |
| building | Curtin Institutional Repository |
| collection | Online Access |
| description | The necrotrophic fungal pathogen Parastagonospora nodorum is the causal agent of Septoria nodorum leaf blotch and glume blotch, which are common wheat (Triticum aestivum L.) diseases in humid and temperate areas. Susceptibility to Septoria nodorum leaf blotch can partly be explained by sensitivity to corresponding P. nodorum necrotrophic effectors (NEs). Susceptibility to glume blotch is also quantitative; however, the underlying genetics have not been studied in detail. Here, we genetically map resistance/susceptibility loci to leaf and glume blotch using an eight-founder wheat multiparent advanced generation intercross population. The population was assessed in six field trials across two sites and 4 years. Seedling infiltration and inoculation assays using three P. nodorum isolates were also carried out, in order to compare quantitative trait loci (QTL) identified under controlled conditions with those identified in the field. Three significant field resistance QTL were identified on chromosomes 2A and 6A, while four significant seedling resistance QTL were detected on chromosomes 2D, 5B and 7D. Among these, QSnb.niab-2A.3 for field resistance to both leaf blotch and glume blotch was detected in Norway and the UK. Colocation with a QTL for seedling reactions against culture filtrate from a Norwegian P. nodorum isolate indicated the QTL could be caused by a novel NE sensitivity. The consistency of this QTL for leaf blotch at the seedling and adult plant stages and culture filtrate infiltration was confirmed by haplotype analysis. However, opposite effects for the leaf blotch and glume blotch reactions suggest that different genetic mechanisms may be involved. |
| first_indexed | 2025-11-14T11:21:21Z |
| format | Journal Article |
| id | curtin-20.500.11937-83210 |
| institution | Curtin University Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-14T11:21:21Z |
| publishDate | 2020 |
| publisher | SPRINGER |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | curtin-20.500.11937-832102021-05-06T03:00:57Z Genetic mapping using a wheat multi-founder population reveals a locus on chromosome 2A controlling resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum Lin, M. Corsi, B. Ficke, A. Tan, Kar-Chun Cockram, J. Lillemo, M. Science & Technology Life Sciences & Biomedicine Agronomy Plant Sciences Genetics & Heredity Horticulture Agriculture QUANTITATIVE TRAIT LOCI ADULT-PLANT RESISTANCE INTER-CROSS POPULATION HOST-SELECTIVE TOXINS STAGONOSPORA-NODORUM SEPTORIA-NODORUM WINTER-WHEAT HIGH-DENSITY TAN SPOT SEEDLING RESISTANCE The necrotrophic fungal pathogen Parastagonospora nodorum is the causal agent of Septoria nodorum leaf blotch and glume blotch, which are common wheat (Triticum aestivum L.) diseases in humid and temperate areas. Susceptibility to Septoria nodorum leaf blotch can partly be explained by sensitivity to corresponding P. nodorum necrotrophic effectors (NEs). Susceptibility to glume blotch is also quantitative; however, the underlying genetics have not been studied in detail. Here, we genetically map resistance/susceptibility loci to leaf and glume blotch using an eight-founder wheat multiparent advanced generation intercross population. The population was assessed in six field trials across two sites and 4 years. Seedling infiltration and inoculation assays using three P. nodorum isolates were also carried out, in order to compare quantitative trait loci (QTL) identified under controlled conditions with those identified in the field. Three significant field resistance QTL were identified on chromosomes 2A and 6A, while four significant seedling resistance QTL were detected on chromosomes 2D, 5B and 7D. Among these, QSnb.niab-2A.3 for field resistance to both leaf blotch and glume blotch was detected in Norway and the UK. Colocation with a QTL for seedling reactions against culture filtrate from a Norwegian P. nodorum isolate indicated the QTL could be caused by a novel NE sensitivity. The consistency of this QTL for leaf blotch at the seedling and adult plant stages and culture filtrate infiltration was confirmed by haplotype analysis. However, opposite effects for the leaf blotch and glume blotch reactions suggest that different genetic mechanisms may be involved. 2020 Journal Article http://hdl.handle.net/20.500.11937/83210 10.1007/s00122-019-03507-w English http://creativecommons.org/licenses/by/4.0/ SPRINGER fulltext |
| spellingShingle | Science & Technology Life Sciences & Biomedicine Agronomy Plant Sciences Genetics & Heredity Horticulture Agriculture QUANTITATIVE TRAIT LOCI ADULT-PLANT RESISTANCE INTER-CROSS POPULATION HOST-SELECTIVE TOXINS STAGONOSPORA-NODORUM SEPTORIA-NODORUM WINTER-WHEAT HIGH-DENSITY TAN SPOT SEEDLING RESISTANCE Lin, M. Corsi, B. Ficke, A. Tan, Kar-Chun Cockram, J. Lillemo, M. Genetic mapping using a wheat multi-founder population reveals a locus on chromosome 2A controlling resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum |
| title | Genetic mapping using a wheat multi-founder population reveals a locus on chromosome 2A controlling resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum |
| title_full | Genetic mapping using a wheat multi-founder population reveals a locus on chromosome 2A controlling resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum |
| title_fullStr | Genetic mapping using a wheat multi-founder population reveals a locus on chromosome 2A controlling resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum |
| title_full_unstemmed | Genetic mapping using a wheat multi-founder population reveals a locus on chromosome 2A controlling resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum |
| title_short | Genetic mapping using a wheat multi-founder population reveals a locus on chromosome 2A controlling resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum |
| title_sort | genetic mapping using a wheat multi-founder population reveals a locus on chromosome 2a controlling resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen parastagonospora nodorum |
| topic | Science & Technology Life Sciences & Biomedicine Agronomy Plant Sciences Genetics & Heredity Horticulture Agriculture QUANTITATIVE TRAIT LOCI ADULT-PLANT RESISTANCE INTER-CROSS POPULATION HOST-SELECTIVE TOXINS STAGONOSPORA-NODORUM SEPTORIA-NODORUM WINTER-WHEAT HIGH-DENSITY TAN SPOT SEEDLING RESISTANCE |
| url | http://hdl.handle.net/20.500.11937/83210 |