Numerical characterization of AFM images of self-structured surface textures

Results obtained showed that, for the isotropic surfaces, the ABRG method is not considerably affected (i.e. <5%) by image resolution, tip size (for surfaces with large motifs) and noise levels lower than 9%. On the other hand, for anisotropic surfaces, the effects were much stronger (i.e. -34%)....

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Bibliographic Details
Main Authors: Wolski, M., Podsiadlo, P., Stachowiak, Gwidon
Format: Conference Paper
Published: Politecnico di Torino (DIMEAS) 2014
Online Access:http://hdl.handle.net/20.500.11937/8013
Description
Summary:Results obtained showed that, for the isotropic surfaces, the ABRG method is not considerably affected (i.e. <5%) by image resolution, tip size (for surfaces with large motifs) and noise levels lower than 9%. On the other hand, for anisotropic surfaces, the effects were much stronger (i.e. -34%). This indicates that ABRG method can be effective in the analysis of AFM images of self-structured surface textures. However, precautions should be taken when analyzing AFM images of surface textures with small motifs and/or anisotropy. The results also showed that the ABRG method is able to quantify changes in surface roughness occurring during the formation of photoinduced textures. Thus, the method has a potential to become a valuable tool in analyzing formation process of self-structured surfaces.