A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM)

A simple design for an inexpensive, compact, desktop-sized helium free-jet beam source is described. The apparatus, which is Campargue-like in design and utilizes mostly off-the-shelf parts, is capable of producing a centreline intensity of 1.2 × 10^19 atoms per second per steradian. The beam perfor...

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Main Authors: Barr, M., O'Donnell, Kane, Fahy, A., Allison, W., Dastoor, P.
Format: Journal Article
Published: IOP Publishing Ltd 2012
Subjects:
Online Access:http://hdl.handle.net/20.500.11937/7979
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author Barr, M.
O'Donnell, Kane
Fahy, A.
Allison, W.
Dastoor, P.
author_facet Barr, M.
O'Donnell, Kane
Fahy, A.
Allison, W.
Dastoor, P.
author_sort Barr, M.
building Curtin Institutional Repository
collection Online Access
description A simple design for an inexpensive, compact, desktop-sized helium free-jet beam source is described. The apparatus, which is Campargue-like in design and utilizes mostly off-the-shelf parts, is capable of producing a centreline intensity of 1.2 × 10^19 atoms per second per steradian. The beam performance was investigated using a conventional ion gauge and a stagnation detector, with the latter being used to produce beam flux profiles. The profile of the macroskimmed beam has been experimentally demonstrated to be strongly Gaussian.
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format Journal Article
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institution Curtin University Malaysia
institution_category Local University
last_indexed 2025-11-14T06:18:44Z
publishDate 2012
publisher IOP Publishing Ltd
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spelling curtin-20.500.11937-79792017-09-13T14:34:29Z A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM) Barr, M. O'Donnell, Kane Fahy, A. Allison, W. Dastoor, P. Campargue SHeM helium atom microscopy helium beam source helium atom scattering A simple design for an inexpensive, compact, desktop-sized helium free-jet beam source is described. The apparatus, which is Campargue-like in design and utilizes mostly off-the-shelf parts, is capable of producing a centreline intensity of 1.2 × 10^19 atoms per second per steradian. The beam performance was investigated using a conventional ion gauge and a stagnation detector, with the latter being used to produce beam flux profiles. The profile of the macroskimmed beam has been experimentally demonstrated to be strongly Gaussian. 2012 Journal Article http://hdl.handle.net/20.500.11937/7979 10.1088/0957-0233/23/10/105901 IOP Publishing Ltd restricted
spellingShingle Campargue
SHeM
helium atom microscopy
helium beam source
helium atom scattering
Barr, M.
O'Donnell, Kane
Fahy, A.
Allison, W.
Dastoor, P.
A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM)
title A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM)
title_full A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM)
title_fullStr A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM)
title_full_unstemmed A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM)
title_short A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM)
title_sort desktop supersonic free-jet beam source for a scanning helium microscope (shem)
topic Campargue
SHeM
helium atom microscopy
helium beam source
helium atom scattering
url http://hdl.handle.net/20.500.11937/7979