Atom Probe Tomography: Development and Application to the Geosciences
Atom probe tomography (APT) is an analytical technique that provides quantitative three-dimensional elemental and isotopic analyses at sub-nanometre resolution across the whole periodic table. Although developed and mostly used in the materials science and semiconductor fields, recent years have see...
| Main Authors: | , , , , , , |
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| Format: | Journal Article |
| Language: | English |
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WILEY
2020
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| Online Access: | http://purl.org/au-research/grants/arc/DE190101307 http://hdl.handle.net/20.500.11937/79359 |
| _version_ | 1848764037190385664 |
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| author | Reddy, Steven Saxey, David Rickard, William Fougerouse, Denis Montalvo, S.D. Verberne, R. Van Riessen, Arie |
| author_facet | Reddy, Steven Saxey, David Rickard, William Fougerouse, Denis Montalvo, S.D. Verberne, R. Van Riessen, Arie |
| author_sort | Reddy, Steven |
| building | Curtin Institutional Repository |
| collection | Online Access |
| description | Atom probe tomography (APT) is an analytical technique that provides quantitative three-dimensional elemental and isotopic analyses at sub-nanometre resolution across the whole periodic table. Although developed and mostly used in the materials science and semiconductor fields, recent years have seen increasing development and application in the geoscience and planetary science disciplines. Atom probe studies demonstrate compositional complexity at the nanoscale and provide fundamental new insights into the atom-scale mechanisms taking place in minerals over geological time. Here, we provide an overview of APT, including the historical development and technical aspects of the instrumentation, and the fundamentals of data acquisition, data processing and data reconstruction. We also review previous studies and highlight the potential future applications of nanoscale geochemical studies of natural materials. |
| first_indexed | 2025-11-14T11:12:59Z |
| format | Journal Article |
| id | curtin-20.500.11937-79359 |
| institution | Curtin University Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-14T11:12:59Z |
| publishDate | 2020 |
| publisher | WILEY |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | curtin-20.500.11937-793592022-09-06T04:56:43Z Atom Probe Tomography: Development and Application to the Geosciences Reddy, Steven Saxey, David Rickard, William Fougerouse, Denis Montalvo, S.D. Verberne, R. Van Riessen, Arie Science & Technology Physical Sciences Geochemistry & Geophysics atom probe microscopy mineral geochemistry isotope geochemistry nanoscale FIELD-ION MICROSCOPY TRANSMISSION ELECTRON-MICROSCOPY TIME-OF-FLIGHT SPECIMEN PREPARATION GRAIN-BOUNDARIES LOCAL MAGNIFICATION QUANTITATIVE-ANALYSIS KIKUCHI DIFFRACTION SPATIAL-RESOLUTION PHASE BOUNDARIES Atom probe tomography (APT) is an analytical technique that provides quantitative three-dimensional elemental and isotopic analyses at sub-nanometre resolution across the whole periodic table. Although developed and mostly used in the materials science and semiconductor fields, recent years have seen increasing development and application in the geoscience and planetary science disciplines. Atom probe studies demonstrate compositional complexity at the nanoscale and provide fundamental new insights into the atom-scale mechanisms taking place in minerals over geological time. Here, we provide an overview of APT, including the historical development and technical aspects of the instrumentation, and the fundamentals of data acquisition, data processing and data reconstruction. We also review previous studies and highlight the potential future applications of nanoscale geochemical studies of natural materials. 2020 Journal Article http://hdl.handle.net/20.500.11937/79359 10.1111/ggr.12313 English http://purl.org/au-research/grants/arc/DE190101307 WILEY unknown |
| spellingShingle | Science & Technology Physical Sciences Geochemistry & Geophysics atom probe microscopy mineral geochemistry isotope geochemistry nanoscale FIELD-ION MICROSCOPY TRANSMISSION ELECTRON-MICROSCOPY TIME-OF-FLIGHT SPECIMEN PREPARATION GRAIN-BOUNDARIES LOCAL MAGNIFICATION QUANTITATIVE-ANALYSIS KIKUCHI DIFFRACTION SPATIAL-RESOLUTION PHASE BOUNDARIES Reddy, Steven Saxey, David Rickard, William Fougerouse, Denis Montalvo, S.D. Verberne, R. Van Riessen, Arie Atom Probe Tomography: Development and Application to the Geosciences |
| title | Atom Probe Tomography: Development and Application to the Geosciences |
| title_full | Atom Probe Tomography: Development and Application to the Geosciences |
| title_fullStr | Atom Probe Tomography: Development and Application to the Geosciences |
| title_full_unstemmed | Atom Probe Tomography: Development and Application to the Geosciences |
| title_short | Atom Probe Tomography: Development and Application to the Geosciences |
| title_sort | atom probe tomography: development and application to the geosciences |
| topic | Science & Technology Physical Sciences Geochemistry & Geophysics atom probe microscopy mineral geochemistry isotope geochemistry nanoscale FIELD-ION MICROSCOPY TRANSMISSION ELECTRON-MICROSCOPY TIME-OF-FLIGHT SPECIMEN PREPARATION GRAIN-BOUNDARIES LOCAL MAGNIFICATION QUANTITATIVE-ANALYSIS KIKUCHI DIFFRACTION SPATIAL-RESOLUTION PHASE BOUNDARIES |
| url | http://purl.org/au-research/grants/arc/DE190101307 http://hdl.handle.net/20.500.11937/79359 |