Efficient correction for both direction-dependent and baseline-dependent effects in interferometric imaging: An A-stacking framework
© 2015 ESO. A general framework is presented for modeling direction-dependent effects that are also baseline-dependent, as part of the calibration and imaging process. Within this framework such effects are represented as a parametric linear model in which basis functions account for direction depen...
| Main Authors: | , , , , , |
|---|---|
| Format: | Journal Article |
| Published: |
EDP Sciences
2015
|
| Online Access: | http://hdl.handle.net/20.500.11937/71936 |
| Summary: | © 2015 ESO. A general framework is presented for modeling direction-dependent effects that are also baseline-dependent, as part of the calibration and imaging process. Within this framework such effects are represented as a parametric linear model in which basis functions account for direction dependence, whereas expansion coefficients account for the baseline dependence. This separation enables the use ofa multiple fast Fourier transform-based implementation of the forward calculation (sky to visibility) in a manner similar to the W-stacking solution for non-coplanar baselines, and offers a potential improvement in computational efficiency in scenarios where the gridding operation in a convolution-based approach to direction-dependent effects may be too costly. Two novel imaging approaches that are possible within this framework are also presented. |
|---|