Defect-Enhanced Charge Separation and Transfer within Protection Layer/Semiconductor Structure of Photoanodes.

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Defect-Enhanced Charge Separation and Transfer within Protection Layer/Semiconductor Structure of Photoanodes.

Silicon (Si) requires a protection layer to maintain stable and long-time photoanodic reaction. However, poor charge separation and transfer are key constraint factors in protection layer/Si photoanodes that reduce their water-splitting efficiency. Here, a simultaneous enhancement of charge separati...

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Bibliographic Details
Main Authors:	Zheng, Jianyun, Lyu, Y., Xie, C., Wang, R., Tao, L., Wu, H., Zhou, H., Jiang, San Ping, Wang, S.
Format:	Journal Article
Published:	Wiley - V C H Verlag GmbH & Co. KGaA 2018
Online Access:	http://hdl.handle.net/20.500.11937/69737

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