The optimization of zircon analyses by laser-assisted atom probe microscopy: Insights from the 91500 zircon standard

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The optimization of zircon analyses by laser-assisted atom probe microscopy: Insights from the 91500 zircon standard

© 2018 American Geophysical Union. As a quantitative nanoscale chemical analysis technique, atom probe microscopy (APM) typically requires careful tuning and optimization of data acquisition parameters in order to obtain the highest quality results. While there is growing interest in the analysis of...

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Bibliographic Details
Main Authors:	Saxey, David, Reddy, Steven, Fougerouse, Denis, Rickard, William
Format:	Book Chapter
Published:	2017
Online Access:	http://hdl.handle.net/20.500.11937/69253

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