Simultaneous X-ray diffraction, crystallography and fluorescence mapping using the Maia detector
© 2017 Acta Materialia Inc. Interactions between neighboring grains influence the macroscale behavior of polycrystalline materials, particularly their deformation behavior, damage initiation and propagation mechanisms. However, mapping all of the critical material properties normally requires that s...
| Main Authors: | , , , , , , , , , |
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| Format: | Journal Article |
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Pergamon Press
2018
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| Online Access: | http://hdl.handle.net/20.500.11937/58842 |
| _version_ | 1848760355834036224 |
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| author | Kirkwood, H. de Jonge, M. Muránsky, O. Hofmann, F. Howard, D. Ryan, C. van Riessen, G. Rowles, Matthew Paradowska, A. Abbey, B. |
| author_facet | Kirkwood, H. de Jonge, M. Muránsky, O. Hofmann, F. Howard, D. Ryan, C. van Riessen, G. Rowles, Matthew Paradowska, A. Abbey, B. |
| author_sort | Kirkwood, H. |
| building | Curtin Institutional Repository |
| collection | Online Access |
| description | © 2017 Acta Materialia Inc. Interactions between neighboring grains influence the macroscale behavior of polycrystalline materials, particularly their deformation behavior, damage initiation and propagation mechanisms. However, mapping all of the critical material properties normally requires that several independent measurements are performed. Here we report the first grain mapping of a polycrystalline foil using a pixelated energy-dispersive X-ray area detector, simultaneously measuring X-ray fluorescence and diffraction with the Maia detector in order to determine grain orientation and estimate lattice strain. These results demonstrate the potential of the next generation of X-ray area detectors for materials characterization. By scanning the incident X-ray energy we investigate these detectors as a complete solution for simultaneously mapping the crystallographic and chemical properties of the sample. The extension of these techniques to broadband X-ray sources is also discussed. |
| first_indexed | 2025-11-14T10:14:28Z |
| format | Journal Article |
| id | curtin-20.500.11937-58842 |
| institution | Curtin University Malaysia |
| institution_category | Local University |
| last_indexed | 2025-11-14T10:14:28Z |
| publishDate | 2018 |
| publisher | Pergamon Press |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | curtin-20.500.11937-588422017-11-28T06:37:21Z Simultaneous X-ray diffraction, crystallography and fluorescence mapping using the Maia detector Kirkwood, H. de Jonge, M. Muránsky, O. Hofmann, F. Howard, D. Ryan, C. van Riessen, G. Rowles, Matthew Paradowska, A. Abbey, B. © 2017 Acta Materialia Inc. Interactions between neighboring grains influence the macroscale behavior of polycrystalline materials, particularly their deformation behavior, damage initiation and propagation mechanisms. However, mapping all of the critical material properties normally requires that several independent measurements are performed. Here we report the first grain mapping of a polycrystalline foil using a pixelated energy-dispersive X-ray area detector, simultaneously measuring X-ray fluorescence and diffraction with the Maia detector in order to determine grain orientation and estimate lattice strain. These results demonstrate the potential of the next generation of X-ray area detectors for materials characterization. By scanning the incident X-ray energy we investigate these detectors as a complete solution for simultaneously mapping the crystallographic and chemical properties of the sample. The extension of these techniques to broadband X-ray sources is also discussed. 2018 Journal Article http://hdl.handle.net/20.500.11937/58842 10.1016/j.actamat.2017.10.025 Pergamon Press restricted |
| spellingShingle | Kirkwood, H. de Jonge, M. Muránsky, O. Hofmann, F. Howard, D. Ryan, C. van Riessen, G. Rowles, Matthew Paradowska, A. Abbey, B. Simultaneous X-ray diffraction, crystallography and fluorescence mapping using the Maia detector |
| title | Simultaneous X-ray diffraction, crystallography and fluorescence mapping using the Maia detector |
| title_full | Simultaneous X-ray diffraction, crystallography and fluorescence mapping using the Maia detector |
| title_fullStr | Simultaneous X-ray diffraction, crystallography and fluorescence mapping using the Maia detector |
| title_full_unstemmed | Simultaneous X-ray diffraction, crystallography and fluorescence mapping using the Maia detector |
| title_short | Simultaneous X-ray diffraction, crystallography and fluorescence mapping using the Maia detector |
| title_sort | simultaneous x-ray diffraction, crystallography and fluorescence mapping using the maia detector |
| url | http://hdl.handle.net/20.500.11937/58842 |