Influence of Rock Microstructure on its Electrical Properties: An Analysis Using X-ray Microcomputed Tomography
Precise understanding of rock properties on a subsurface formation is one of the most important factors in petrophysic and hydrogeology studies. For decades, electrical resistivity has been extensively analysed, as it has essential capability to evaluate rock formation. The liquid content and water...
| Main Authors: | , , , , |
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| Format: | Conference Paper |
| Published: |
2017
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| Online Access: | http://hdl.handle.net/20.500.11937/58038 |
| _version_ | 1848760161782464512 |
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| author | Rahman, Taufiq Lebedev, Maxim Zhang, Yihuai Barifcani, Ahmed Iglauer, Stefan |
| author_facet | Rahman, Taufiq Lebedev, Maxim Zhang, Yihuai Barifcani, Ahmed Iglauer, Stefan |
| author_sort | Rahman, Taufiq |
| building | Curtin Institutional Repository |
| collection | Online Access |
| description | Precise understanding of rock properties on a subsurface formation is one of the most important factors in petrophysic and hydrogeology studies. For decades, electrical resistivity has been extensively analysed, as it has essential capability to evaluate rock formation. The liquid content and water conductivity used as key parameters to measure the resistivity value of a rock formation. However, few explanation about the rock microstructure influences its resistivity level. The objective of this research is to investigate this fundamental relationship. We found that pores and grains distribution, which is micrometer sizes, are the deciding factors for fluid accommodation, as well as the results deduced from electrical measurement devices are also depend on these parameters. |
| first_indexed | 2025-11-14T10:11:23Z |
| format | Conference Paper |
| id | curtin-20.500.11937-58038 |
| institution | Curtin University Malaysia |
| institution_category | Local University |
| last_indexed | 2025-11-14T10:11:23Z |
| publishDate | 2017 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | curtin-20.500.11937-580382018-01-10T07:29:13Z Influence of Rock Microstructure on its Electrical Properties: An Analysis Using X-ray Microcomputed Tomography Rahman, Taufiq Lebedev, Maxim Zhang, Yihuai Barifcani, Ahmed Iglauer, Stefan Precise understanding of rock properties on a subsurface formation is one of the most important factors in petrophysic and hydrogeology studies. For decades, electrical resistivity has been extensively analysed, as it has essential capability to evaluate rock formation. The liquid content and water conductivity used as key parameters to measure the resistivity value of a rock formation. However, few explanation about the rock microstructure influences its resistivity level. The objective of this research is to investigate this fundamental relationship. We found that pores and grains distribution, which is micrometer sizes, are the deciding factors for fluid accommodation, as well as the results deduced from electrical measurement devices are also depend on these parameters. 2017 Conference Paper http://hdl.handle.net/20.500.11937/58038 10.1016/j.egypro.2017.03.1651 http://creativecommons.org/licenses/by-nc-nd/4.0/ fulltext |
| spellingShingle | Rahman, Taufiq Lebedev, Maxim Zhang, Yihuai Barifcani, Ahmed Iglauer, Stefan Influence of Rock Microstructure on its Electrical Properties: An Analysis Using X-ray Microcomputed Tomography |
| title | Influence of Rock Microstructure on its Electrical Properties: An Analysis Using X-ray Microcomputed Tomography |
| title_full | Influence of Rock Microstructure on its Electrical Properties: An Analysis Using X-ray Microcomputed Tomography |
| title_fullStr | Influence of Rock Microstructure on its Electrical Properties: An Analysis Using X-ray Microcomputed Tomography |
| title_full_unstemmed | Influence of Rock Microstructure on its Electrical Properties: An Analysis Using X-ray Microcomputed Tomography |
| title_short | Influence of Rock Microstructure on its Electrical Properties: An Analysis Using X-ray Microcomputed Tomography |
| title_sort | influence of rock microstructure on its electrical properties: an analysis using x-ray microcomputed tomography |
| url | http://hdl.handle.net/20.500.11937/58038 |