Monitoring Process Variability with Individual Measurements Following Elliptically Contoured Distributions

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Monitoring Process Variability with Individual Measurements Following Elliptically Contoured Distributions

Bibliographic Details
Main Authors:	Khawsithiwong, P., Yatawara, Nihal
Format:	Journal Article
Published:	Taylor and Francis 2007
Online Access:	http://hdl.handle.net/20.500.11937/5507

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