Monitoring Process Variability with Individual Measurements Following Elliptically Contoured Distributions

Bibliographic Details
Main Authors: Khawsithiwong, P., Yatawara, Nihal
Format: Journal Article
Published: Taylor and Francis 2007
Online Access:http://hdl.handle.net/20.500.11937/5507
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author Khawsithiwong, P.
Yatawara, Nihal
author_facet Khawsithiwong, P.
Yatawara, Nihal
author_sort Khawsithiwong, P.
building Curtin Institutional Repository
collection Online Access
first_indexed 2025-11-14T06:07:28Z
format Journal Article
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institution Curtin University Malaysia
institution_category Local University
last_indexed 2025-11-14T06:07:28Z
publishDate 2007
publisher Taylor and Francis
recordtype eprints
repository_type Digital Repository
spelling curtin-20.500.11937-55072017-02-28T01:29:29Z Monitoring Process Variability with Individual Measurements Following Elliptically Contoured Distributions Khawsithiwong, P. Yatawara, Nihal 2007 Journal Article http://hdl.handle.net/20.500.11937/5507 Taylor and Francis restricted
spellingShingle Khawsithiwong, P.
Yatawara, Nihal
Monitoring Process Variability with Individual Measurements Following Elliptically Contoured Distributions
title Monitoring Process Variability with Individual Measurements Following Elliptically Contoured Distributions
title_full Monitoring Process Variability with Individual Measurements Following Elliptically Contoured Distributions
title_fullStr Monitoring Process Variability with Individual Measurements Following Elliptically Contoured Distributions
title_full_unstemmed Monitoring Process Variability with Individual Measurements Following Elliptically Contoured Distributions
title_short Monitoring Process Variability with Individual Measurements Following Elliptically Contoured Distributions
title_sort monitoring process variability with individual measurements following elliptically contoured distributions
url http://hdl.handle.net/20.500.11937/5507