APA (7th ed.) Citation

Hellerstedt, J., Edmonds, M., Ramakrishnan, N., Liu, C., Weber, B., Tadich, A., . . . Fuhrer, M. (2016). Electronic Properties of High-Quality Epitaxial Topological Dirac Semimetal Thin Films. American Chemical Society.

Chicago Style (17th ed.) Citation

Hellerstedt, J., M. Edmonds, N. Ramakrishnan, C. Liu, B. Weber, A. Tadich, Kane O'Donnell, S. Adam, and M. Fuhrer. Electronic Properties of High-Quality Epitaxial Topological Dirac Semimetal Thin Films. American Chemical Society, 2016.

MLA (9th ed.) Citation

Hellerstedt, J., et al. Electronic Properties of High-Quality Epitaxial Topological Dirac Semimetal Thin Films. American Chemical Society, 2016.