Macroscopic electrical field distribution and field-induced surface stresses of needle-shaped field emitters

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Macroscopic electrical field distribution and field-induced surface stresses of needle-shaped field emitters

One major concern since the development of the field ion microscope is the mechanical strength of the specimens. The macroscopic shape of the imaging tip greatly influences field-induced stresses and there is merit in further study of this phenomenon from a classical perspective. Understanding the g...

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Bibliographic Details
Main Authors:	Loo Chin Moy, Charles, Ranzi, G., Petersen, T., Ringer, S.
Format:	Journal Article
Published:	Elsevier 2011
Online Access:	http://hdl.handle.net/20.500.11937/50501

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