Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities
Due to their operation principle atomic force microscopes (AFMs) are sensitive to all factors affecting the detected force between the probe and the sample. Relative humidity is an important and often neglected—both in experiments and simulations—factor in the interaction force between AFM probe and...
| Main Authors: | Seppä, J., Reischl, Bernhard, Sairanen, H., Korpelainen, V., Husu, H., Heinonen, M., Raiteri, P., Rohl, Andrew, Nordlund, K., Lassila, A. |
|---|---|
| Format: | Journal Article |
| Published: |
IOP Publishing Ltd
2017
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| Online Access: | http://purl.org/au-research/grants/arc/DP140101776 http://hdl.handle.net/20.500.11937/4837 |
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