Seppä, J., Reischl, B., Sairanen, H., Korpelainen, V., Husu, H., Heinonen, M., . . . Lassila, A. (2017). Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities. IOP Publishing Ltd.
Chicago Style (17th ed.) CitationSeppä, J., et al. Atomic Force Microscope Adhesion Measurements and Atomistic Molecular Dynamics Simulations at Different Humidities. IOP Publishing Ltd, 2017.
MLA (9th ed.) CitationSeppä, J., et al. Atomic Force Microscope Adhesion Measurements and Atomistic Molecular Dynamics Simulations at Different Humidities. IOP Publishing Ltd, 2017.
Warning: These citations may not always be 100% accurate.