Optimal metric selection for improved multi-pose face recognition with group information

We address the limitation of sparse representation based classification with group information for multi-pose face recognition. First, we observe that the key issue of such classification problem lies in the choice of the metric norm of the residual vectors, which represent the fitness of each class...

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Main Authors: Zhang, X., Pham, DucSon, Liu, W., Venkatesh, S.
Other Authors: N/A
Format: Conference Paper
Published: ICPR 2012
Subjects:
Online Access:http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6460470
http://hdl.handle.net/20.500.11937/46687
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author Zhang, X.
Pham, DucSon
Liu, W.
Venkatesh, S.
author2 N/A
author_facet N/A
Zhang, X.
Pham, DucSon
Liu, W.
Venkatesh, S.
author_sort Zhang, X.
building Curtin Institutional Repository
collection Online Access
description We address the limitation of sparse representation based classification with group information for multi-pose face recognition. First, we observe that the key issue of such classification problem lies in the choice of the metric norm of the residual vectors, which represent the fitness of each class. Then we point out that limitation of the current sparse representation classification algorithms is the wrong choice of the ℓ2 norm, which does not match with data statistics as these residual values may be considerably non-Gaussian. We propose an explicit but effective solution using ℓp norm and explain theoretically and numerically why such metric norm would be able to suppress outliers and thus can significantly improve classification performance comparable to the state-of-arts algorithms on some challenging datasets.
first_indexed 2025-11-14T09:31:08Z
format Conference Paper
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institution Curtin University Malaysia
institution_category Local University
last_indexed 2025-11-14T09:31:08Z
publishDate 2012
publisher ICPR
recordtype eprints
repository_type Digital Repository
spelling curtin-20.500.11937-466872017-01-30T15:28:42Z Optimal metric selection for improved multi-pose face recognition with group information Zhang, X. Pham, DucSon Liu, W. Venkatesh, S. N/A vectors training face face recognition lighting robustness measurement We address the limitation of sparse representation based classification with group information for multi-pose face recognition. First, we observe that the key issue of such classification problem lies in the choice of the metric norm of the residual vectors, which represent the fitness of each class. Then we point out that limitation of the current sparse representation classification algorithms is the wrong choice of the ℓ2 norm, which does not match with data statistics as these residual values may be considerably non-Gaussian. We propose an explicit but effective solution using ℓp norm and explain theoretically and numerically why such metric norm would be able to suppress outliers and thus can significantly improve classification performance comparable to the state-of-arts algorithms on some challenging datasets. 2012 Conference Paper http://hdl.handle.net/20.500.11937/46687 http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6460470 ICPR fulltext
spellingShingle vectors
training
face
face recognition
lighting
robustness
measurement
Zhang, X.
Pham, DucSon
Liu, W.
Venkatesh, S.
Optimal metric selection for improved multi-pose face recognition with group information
title Optimal metric selection for improved multi-pose face recognition with group information
title_full Optimal metric selection for improved multi-pose face recognition with group information
title_fullStr Optimal metric selection for improved multi-pose face recognition with group information
title_full_unstemmed Optimal metric selection for improved multi-pose face recognition with group information
title_short Optimal metric selection for improved multi-pose face recognition with group information
title_sort optimal metric selection for improved multi-pose face recognition with group information
topic vectors
training
face
face recognition
lighting
robustness
measurement
url http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6460470
http://hdl.handle.net/20.500.11937/46687