Using XPS to determine solute solubility in room temperature ionic liquids
X-Ray Photoelectron Spectroscopy (XPS) was used to quantify the amount of bromide ions present in two samples of [C4mpyrr]Br dissolved in the room temperature ionic liquid (RTIL) [C4mpyrr][N(Tf)2]. One sample was of a known concentration (0.436 Br atom%); the other was a saturated solution. The...
| Main Authors: | , , , , , |
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| Format: | Journal Article |
| Published: |
The Royal Society of Chemistry
2007
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| Online Access: | http://hdl.handle.net/20.500.11937/4632 |
| Summary: | X-Ray Photoelectron Spectroscopy (XPS) was used to quantify the amount of bromide ions present in two samples of [C4mpyrr]Br dissolved in the room temperature ionic liquid (RTIL) [C4mpyrr][N(Tf)2]. One sample was of a known concentration (0.436 Br atom%); the other was a saturated solution. The results obtained from quantitative XPS analysis indicated that the saturated sample had a concentration, or solubility, of 0.90 Br atom% (746 mM) at 298 K, which was then independently confirmed by potential-step chronoamperometry of the same solution. |
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