Flexible and modular virtual scanning probe microscope

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Flexible and modular virtual scanning probe microscope

Non-contact Atomic Force Microscopy (NC-AFM) is an experimental technique capable of imaging almost any surface with atomic resolution, in a wide variety of environments. Linking measured images to real understanding of system properties is often difficult, and many studies combine experiments with...

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Bibliographic Details
Main Authors:	Tracey, J., Federici Canova, F., Keisanen, O., Gao, D., Spijker, P., Reischl, Bernhard, Foster, A.
Format:	Journal Article
Published:	Elsevier 2015
Online Access:	http://hdl.handle.net/20.500.11937/45688

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