Flexible and modular virtual scanning probe microscope

Non-contact Atomic Force Microscopy (NC-AFM) is an experimental technique capable of imaging almost any surface with atomic resolution, in a wide variety of environments. Linking measured images to real understanding of system properties is often difficult, and many studies combine experiments with...

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Main Authors: Tracey, J., Federici Canova, F., Keisanen, O., Gao, D., Spijker, P., Reischl, Bernhard, Foster, A.
Format: Journal Article
Published: Elsevier 2015
Online Access:http://hdl.handle.net/20.500.11937/45688
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author Tracey, J.
Federici Canova, F.
Keisanen, O.
Gao, D.
Spijker, P.
Reischl, Bernhard
Foster, A.
author_facet Tracey, J.
Federici Canova, F.
Keisanen, O.
Gao, D.
Spijker, P.
Reischl, Bernhard
Foster, A.
author_sort Tracey, J.
building Curtin Institutional Repository
collection Online Access
description Non-contact Atomic Force Microscopy (NC-AFM) is an experimental technique capable of imaging almost any surface with atomic resolution, in a wide variety of environments. Linking measured images to real understanding of system properties is often difficult, and many studies combine experiments with detailed modelling, in particular using virtual simulators to directly mimic experimental operation. In this work we present the PyVAFM, a flexible and modular based virtual atomic force microscope capable of simulating any operational mode or set-up. Furthermore, the PyVAFM is fully expandable to allow novel and unique set-ups to be simulated, finally the PyVAFM ships with fully developed documentation and tutorial to increase usability.
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format Journal Article
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institution Curtin University Malaysia
institution_category Local University
last_indexed 2025-11-14T09:26:46Z
publishDate 2015
publisher Elsevier
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spelling curtin-20.500.11937-456882017-09-13T14:23:35Z Flexible and modular virtual scanning probe microscope Tracey, J. Federici Canova, F. Keisanen, O. Gao, D. Spijker, P. Reischl, Bernhard Foster, A. Non-contact Atomic Force Microscopy (NC-AFM) is an experimental technique capable of imaging almost any surface with atomic resolution, in a wide variety of environments. Linking measured images to real understanding of system properties is often difficult, and many studies combine experiments with detailed modelling, in particular using virtual simulators to directly mimic experimental operation. In this work we present the PyVAFM, a flexible and modular based virtual atomic force microscope capable of simulating any operational mode or set-up. Furthermore, the PyVAFM is fully expandable to allow novel and unique set-ups to be simulated, finally the PyVAFM ships with fully developed documentation and tutorial to increase usability. 2015 Journal Article http://hdl.handle.net/20.500.11937/45688 10.1016/j.cpc.2015.05.013 Elsevier restricted
spellingShingle Tracey, J.
Federici Canova, F.
Keisanen, O.
Gao, D.
Spijker, P.
Reischl, Bernhard
Foster, A.
Flexible and modular virtual scanning probe microscope
title Flexible and modular virtual scanning probe microscope
title_full Flexible and modular virtual scanning probe microscope
title_fullStr Flexible and modular virtual scanning probe microscope
title_full_unstemmed Flexible and modular virtual scanning probe microscope
title_short Flexible and modular virtual scanning probe microscope
title_sort flexible and modular virtual scanning probe microscope
url http://hdl.handle.net/20.500.11937/45688