Reddy, S., van Riessen, A., Saxey, D., Johnson, T., Rickard, W., Fougerouse, D., . . . Olson, D. (2016). Mechanisms of deformation-induced trace element migration in zircon resolved by atom probe and correlative microscopy. Pergamon.
Chicago Style (17th ed.) CitationReddy, Steven, et al. Mechanisms of Deformation-induced Trace Element Migration in Zircon Resolved by Atom Probe and Correlative Microscopy. Pergamon, 2016.
MLA (9th ed.) CitationReddy, Steven, et al. Mechanisms of Deformation-induced Trace Element Migration in Zircon Resolved by Atom Probe and Correlative Microscopy. Pergamon, 2016.
Warning: These citations may not always be 100% accurate.